Method for growing epitaxial chip of nitride LED structure by MOCVD
A technology of light-emitting diodes and epitaxial wafers, applied in gaseous chemical plating, coating, metal material coating process, etc., can solve problems such as the influence of GaN buffer layer LED structure performance
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0024] Using Aix2000HT MOCVD system to epitaxially grow GaN-based ultra-high brightness LED structure epitaxial wafers. Sapphire (Al 2 o 3 ). Such as figure 1 As shown, first, the substrate 7 is heated to 1200° C., and treated at high temperature under hydrogen for 10 minutes; then the temperature is lowered to 500-540° C. to grow a GaN nucleation layer 6, about 25 nanometers, and the TMGa flow rate is 2.2×10 -5 mol / min, NH 3 The flow rate is 5 liters / minute; thereafter, the growth temperature is raised to 1160° C. to anneal the nucleation layer 6 for 4-8 minutes. After the annealing, at 1160° C., by linearly changing the flow rate of TMGa, the variable-rate epitaxial growth of the GaN buffer layer 5 is started, and the growth time is 90 seconds. TMGa flow from 2-6.63×10 -5 Mole / min linear change to 15-20×10 -5mol / min, NH 3 The flow rate is 3.5 l / min. Thereafter, the growth temperature was increased to 1180° C., and a GaN buffer layer with a thickness of 3.5 microns w...
Embodiment 2
[0026] Using Aix 2000HT MOCVD system to epitaxially grow GaN-based ultra-high brightness LED structure epitaxial wafers. Sapphire (Al 2 o 3 ). Such as figure 1 As shown, firstly, the substrate 7 is heated to 1200° C., and treated at a high temperature under hydrogen for 10 minutes; then the temperature is lowered to 510-540° C. to grow a GaN nucleation layer 6, about 25 nanometers, and the flow rate of TMGa is 2.2×10 -5 mol / min, NH 3 The flow rate is 5 liters / minute; thereafter, the growth temperature is raised to 1160° C. to anneal the nucleation layer 6 for 4-8 minutes. After annealing, at 1600°C, by linearly changing the flow rate of TMGa, the GaN buffer layer 5 was grown at a variable rate, the growth time was 90 seconds, and the flow rate of TMGa was from 2-6.63×10 -5 mol / min linear change to 15-17.72×10 -5 mol / min, NH 3 The flow rate is 3.5 liters / minute, and thereafter, the growth temperature is increased to 1180° C., and a GaN buffer layer with a thickness of 3....
PUM
| Property | Measurement | Unit |
|---|---|---|
| thickness | aaaaa | aaaaa |
| thickness | aaaaa | aaaaa |
| emission peak | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com
