Soybean having epistatic genes affecting yield

An allele and gene technology, applied in the field of soybeans with epistatic genes that affect yield, can solve the problems of affecting height and plant height having no obvious effect
CN1261252AInactive Publication Date: 2000-07-26UTAH STATE UNIVERSITY +1
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
UTAH STATE UNIVERSITY
Publication Date
2000-07-26
Estimated Expiration
Not applicable · inactive patent

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Abstract

A method of plant breeding applicable to self-pollinating plants, and plants produced by use of the method, includes the use of molecular markers linked to interacting loci that affect traits of agronomic value. The method allows one to identify a first molecular marker linked to a quantitative trait locus (QTL) and a second molecular marker linked to a modifying locus having an epistatic effect in combination with the QTL. Conventional breeding steps can then be used to introgress the interacting loci into other plant varieties.
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Description

[0001] Related Application Cross Documentation

[0002] This application claims priority to US Provisional Application No. 60 / 045,421, filed May 2, 1997, and US Patent Application, filed April 30, 1998 (application numbers not yet assigned).

[0003] Statement Regarding Federally Sponsored Research and Development

[0004] Research on the present invention was supported in part by National Institutes of Health grant GM42337. The US Government has certain rights in this invention. Background of the invention

[0005] Agricultural traits of major concern to plant breeders of field crops are eg plant height, time to germination, time to maturity, crop yield, disease resistance, resistance to environmental stress, etc. These traits are rarely controlled by a single gene, or not controlled by a single gene. Rather, traits are usually controlled by genes whose effects are reluctantly quantitative, that is, whose ...

Claims

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