Probe cleaning device

A technology for probes and cleaning fluids, applied in measuring devices, measuring leads/probes, cleaning methods using liquids, etc., can solve problems such as confirmation troubles, difficulties in use and purchase, and insufficient contact, etc., to achieve high efficiency and reliability Effects of cleaning, miniaturization, and prevention of solvent cracks

Inactive Publication Date: 2006-12-20
MITSUBISHI ELECTRIC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, since the corroded coil spring prevents the sliding probe from sliding a predetermined distance, there is a problem that the contact between the probe and each terminal of the printed circuit board is insufficient, and precise continuity inspection cannot be performed.
In addition, when using isopropyl alcohol (IPA) or glycol ether (GE) as a cleaning solution, it is difficult to use and purchase, and there are cracks caused by the penetration of the cleaning solution into the plug board, etc. The problem of damage (hereinafter referred to as solvent cracking) requires a separate device for spraying cleaning liquid and cleaning air, so there is a problem of increasing the size of the device itself
In addition, in the conventional probe cleaning device, the customer has to check the fine probes visually or with a magnifying glass for the dirt falling off, so there is a problem that it is troublesome to check after cleaning.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0018] figure 1 It is a partial sectional view showing the structure of the probe cleaning device according to Embodiment 1 of the present invention, figure 2 is for figure 1 It is a front view of the ultraviolet irradiating device with different components used for cleaning the probe of the probe cleaning device shown.

[0019] Such as figure 1 As shown, the probe cleaning device 1 is to ultrasonically clean the stylus at the front ends of a plurality of probes (PP) 101 that are vertically fixed in a plug board (PB) 201 as a fixed member and facing downward. The clean cleaning device mainly includes: a bottomed box-shaped cleaning container 3 for holding the cleaning liquid 2; a plug-in connector that is arranged on the inner bottom of the cleaning container 3 and makes the probe 101 face downward; The pillar (support member) 4 that supports the plate 201 horizontally; the outer case 6 having the upper opening edge 6a that supports the outer edge 3b of the upper opening 3...

Embodiment 2

[0032] image 3 It is a partial sectional view showing the structure of the probe cleaning device according to the second embodiment of the present invention. Among the constituent members of the second embodiment, the same reference numerals are used for the parts common to the constituent members of the first embodiment, and descriptions of these parts are omitted.

[0033] The second embodiment is characterized in that a reflection mirror 12 is provided at the inner bottom of the cleaning container 3 to reflect ultraviolet light from the backlight 11 to the part of the contact needle of the probe 101 . In the present embodiment 2, the backlight 11 is arranged obliquely above the cleaning container 3, and it can irradiate ultraviolet rays to the reflector 12 in the cleaning container 3 from obliquely above the upper opening 3a of the cleaning container 3. In addition, when the inside of the cleaning container 3 is formed of a material that can transmit ultraviolet rays, the...

Embodiment 3

[0040] Figure 4 It is a partial cross-sectional view showing the structure of an automatic probe cleaning device according to Embodiment 3 of the present invention, Figure 5 is for illustration Figure 4 The flow chart showing the operation of the automatic probe cleaning device. Among the constituent members of the third embodiment, the same symbols are used for the parts common to the constituent members of the first embodiment, and the description of the parts is omitted.

[0041] The third embodiment is characterized in that the cleaning of the contact portion of the probe 101 by ultrasonic vibration is automated. That is, if Figure 4 As shown, an invisible light transmission area 3c such as ultraviolet rays is formed at the bottom of the cleaning container 3 of the automatic probe cleaning device 20, and the lower side of the invisible light transmission area 3c in the inner space 8 is equipped with an invisible light illumination function. The image recognition ca...

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PUM

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Abstract

Provided is a small probe pin cleaner that can reliably clean only a stylus part of probe pin without causing a probe-pin-supporting pinboard to suffer from disadvantage such as solvent crack after being cleaned and is easy to confirm its cleaning. The probe pin cleaner 1 is substantially composed of a bottomed-box-type cleaning container 3 that holds a cleaning fluid 2 such as ethanol; stays 4 that are set on the inner bottom of the cleaning container 3 and horizontally support a pinboard PB with its downward probe pins PP; an outer box 6 having an upper opening edge part 6a which supports the outer edge 3b of the upper opening port 3a of the cleaning container 3 through a shock absorbing material 5; and an ultrasonic vibration generator 7.

Description

technical field [0001] The present invention relates to a non-contact probe cleaning device that cleans a cleaning jig without contacting a probe fixed to a socket. Background technique [0002] The live test is used to measure the electrical parameters between the terminals of the printed circuit board on which the chip components are mounted to check for poor wiring, wrong installation, or defective components. In the electrification test, a test jig (hereinafter referred to as a socket board) for fixing a plurality of probes corresponding to respective terminals of a printed circuit board to be tested is used. In the case where the plug board is slidably held in the lengthwise direction of the probe by a sliding part composed of a bush and a coil spring arranged in the bush, the probe can be slid in a specified position during the continuity check. The pressing force is in contact with each terminal of the printed circuit board. However, after the continuity check, the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B08B3/12B08B3/08G01R1/06G01R1/073G01R3/00H01L21/66
CPCB08B3/12G01R1/07307G01R3/00
Inventor 斋藤文一久保胜英
Owner MITSUBISHI ELECTRIC CORP
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