Dual in-line package type double-contact text fixture

A test fixture and double-contact technology, applied in electronic circuit testing, single semiconductor device testing, etc., can solve the problems of poor contact between the test fixture and the measured object, and can not be completely improved, so as to reduce the test cost and reduce the probability of poor contact , the effect of increasing the contact area

Inactive Publication Date: 2003-07-30
MACRONIX INT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, one of the main reasons for the misjudgment of qualified products as defective products in integrated circuit testing is poor contact between the test fixture and the object under test, so the use of Kelvin contact pins 200 still cannot completely solve this problem

Method used

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  • Dual in-line package type double-contact text fixture
  • Dual in-line package type double-contact text fixture
  • Dual in-line package type double-contact text fixture

Examples

Experimental program
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Embodiment Construction

[0047] Figure 3 to Figure 5 It is a schematic diagram of a dual-contact test fixture in a double-sided in-line packaging type according to a preferred embodiment of the present invention. Image 6 It is a front view of a dual-contact contact sheet and a side view of a contact pin in a preferred embodiment of the present invention.

[0048] Please also refer to Figure 3 to Figure 6 As shown, the double-contact test fixture 300 of the present invention is composed of a main body 302 , a double-contact contact piece 304 , a metal ground piece 308 , a soft insulating piece 306 , a push rod 310 , and a cover 312 . Two double-contact contact pieces 304 are respectively located on the two corresponding side walls 302a of the main body 302, two soft insulation pieces 306 are respectively located on the double-contact contact piece 304, and two metal grounding pieces 308 are respectively located on the soft insulation pieces 306 The upper and second push rods 310 are respectively l...

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PUM

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Abstract

The dual in-line package type double-contact test fixture consists of main body, two double contact sheets, two earthing metal sheets and two soft insulating sheets, and in which the two double contact sheets are on two opposite side walls of the main body, the two soft insulating sheets are on the two double contact sheets separately, and the two earthing metal sheets are on the two soft insulating sheets separately.

Description

technical field [0001] The present invention relates to a test fixture of a tester for integrated circuit finished products, and in particular to a double-contact test fixture of a dual in line packaging type for a finished integrated circuit tester. Background technique [0002] It is known that after the finished integrated circuit is completed, in order to confirm whether the finished integrated circuit meets the required specifications, the single-contact test fixture of the integrated circuit finished product testing machine is used to test the finished integrated circuit to confirm that the finished integrated circuit can meet the requirements. required specifications. [0003] Please refer to figure 1 Shown is a front view of a known single-contact contact piece and a side view of a single-contact contact foot. The single-contact contact sheet 108 is formed by arranging and fixing a plurality of single-contact contact pins 100 at a fixed interval through insulating ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R31/28
Inventor 施光华陈金福江元一
Owner MACRONIX INT CO LTD
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