Complex microwave dielectric constant measuring method for ceramic with high dielectric constant and low loss

A technology of complex permittivity and microwave dielectric, applied in the direction of testing dielectric strength, using microwave means for material analysis, measuring devices, etc., can solve the problems that the test accuracy and test range are difficult to meet the actual needs, etc.

Inactive Publication Date: 2003-11-05
HUAZHONG UNIV OF SCI & TECH
View PDF0 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the test accuracy and test range of the cu

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Complex microwave dielectric constant measuring method for ceramic with high dielectric constant and low loss

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] TE in a dielectric pillar resonator 0ml The characteristic equation of the modulus is u J 0 ( u ) J 1 ( u ) + w K 0 ( w ) K 1 ( w ) = 0 - - - ( 1 ) where J 0 and J 1 are the zero-order and first-order Bessel functions of the first kind, respectively, K 0 and K 1 are the zero-order and first-order B...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention is complex microwave dielectric constant measuring method for ceramic with high dielectric constant and low loss. The method can solve the front and reverse TE0m1 mode questionin dielectric column strictly, and can measure the surface resistance of metal and the dielectric loss of sample simply and reliably. Via measuring radius, height and TE011 mode resonant frequency of sample, the complex dielectric constant may be calculated through indirect problem algorithm. Via measuring the resonant frequency of two higher TE modes near the resonant frequency, loaded qualityfactor and scattering parameter S21 in the resonant frequency, and substituting the data into obtained relationship equation, the dielectric loss of sample may be obtained.

Description

technical field [0001] The invention belongs to the technical field of testing microwave components, and in particular relates to a testing method for microwave complex dielectric constant of high-dielectric and low-loss ceramics. Background technique [0002] In recent years, with the extraordinary development of the wireless communication industry, the demand for high-dielectric and low-loss ceramics used in microwave dielectric devices such as dielectric resonators and filters is increasing day by day. However, the development of new high-dielectric and low-loss ceramics and related devices has been plagued by microwave complex permittivity testing. [0003] Microwave dielectric testing methods include free space method, transmission / reflection method and resonance method. The resonance method is the best method to accurately test the microwave complex dielectric constant of high-dielectric and low-loss ceramics. In the resonant cavity under a single main mode, either th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N22/00G01R27/26G01R31/12
Inventor 周东祥龚树萍陈晓平梁飞潘杰夫
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products