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Complex microwave dielectric constant measuring method for ceramic with high dielectric constant and low loss

A technology of complex permittivity and microwave dielectric, applied in the direction of testing dielectric strength, using microwave means for material analysis, measuring devices, etc., can solve the problems that the test accuracy and test range are difficult to meet the actual needs, etc.

Inactive Publication Date: 2003-11-05
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

However, the test accuracy and test range of the current method are difficult to meet the actual needs

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  • Complex microwave dielectric constant measuring method for ceramic with high dielectric constant and low loss

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Embodiment Construction

[0017] TE in a dielectric pillar resonator 0ml The characteristic equation of the modulus is u J 0 ( u ) J 1 ( u ) + w K 0 ( w ) K 1 ( w ) = 0 - - - ( 1 ) where J 0 and J 1 are the zero-order and first-order Bessel functions of the first kind, respectively, K 0 and K 1 are the zero-order and first-order B...

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Abstract

The present invention is complex microwave dielectric constant measuring method for ceramic with high dielectric constant and low loss. The method can solve the front and reverse TE0m1 mode questionin dielectric column strictly, and can measure the surface resistance of metal and the dielectric loss of sample simply and reliably. Via measuring radius, height and TE011 mode resonant frequency of sample, the complex dielectric constant may be calculated through indirect problem algorithm. Via measuring the resonant frequency of two higher TE modes near the resonant frequency, loaded qualityfactor and scattering parameter S21 in the resonant frequency, and substituting the data into obtained relationship equation, the dielectric loss of sample may be obtained.

Description

technical field [0001] The invention belongs to the technical field of testing microwave components, and in particular relates to a testing method for microwave complex dielectric constant of high-dielectric and low-loss ceramics. Background technique [0002] In recent years, with the extraordinary development of the wireless communication industry, the demand for high-dielectric and low-loss ceramics used in microwave dielectric devices such as dielectric resonators and filters is increasing day by day. However, the development of new high-dielectric and low-loss ceramics and related devices has been plagued by microwave complex permittivity testing. [0003] Microwave dielectric testing methods include free space method, transmission / reflection method and resonance method. The resonance method is the best method to accurately test the microwave complex dielectric constant of high-dielectric and low-loss ceramics. In the resonant cavity under a single main mode, either th...

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Application Information

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IPC IPC(8): G01N22/00G01R27/26G01R31/12
Inventor 周东祥龚树萍陈晓平梁飞潘杰夫
Owner HUAZHONG UNIV OF SCI & TECH
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