Testing data compression code, decoding method and special decoding element of slice system

A technology for testing data and system-on-chip, which is used in electronic circuit testing, electrical components, code conversion, etc., and can solve problems such as inability to adapt to non-equidistant code streams, low compression efficiency, and long testing time.

Inactive Publication Date: 2004-02-18
TSINGHUA UNIV
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  • Summary
  • Abstract
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Problems solved by technology

[0004] The purpose of the present invention is to solve the problems in the prior art that the compression efficiency of huge or super large test vectors is low, the test time is long, and the code stream cannot be adapted to the non-equidistant situation

Method used

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  • Testing data compression code, decoding method and special decoding element of slice system
  • Testing data compression code, decoding method and special decoding element of slice system
  • Testing data compression code, decoding method and special decoding element of slice system

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Embodiment Construction

[0021] The present invention will be further described in detail below in conjunction with the diagrams.

[0022] The test data compression encoding and decoding method of the system on chip of the present invention:

[0023] First, the test data is compressed and coded by a computer storing a program, and an adaptive variable-length compression method (i.e., the SAC algorithm) is adopted, including the following steps:

[0024] 1) Carry out the analysis of the test data run length, that is, count the ratio of 0 and 1 in the original test data, if the data bit of 0 in the original test data is less than the data bit of 1, then designate all irrelevant bits as 0, press 0 string Encoding; otherwise, assign all irrelevant bits to 1, and encode by 1 string;

[0025] 2) take the bit string as the basic unit, cut the test data into pieces, count the length of the bit string, utilize the self-adaptive variable length compression method encoding table to convert the bit string length...

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Abstract

The method is as the follows. To make statistic for the ratio of 0 and 1 in original test data, all extranous bits are assigned to be 0 and to code as per 0 string if 0 data bits are less then, data bits in the original test data, otherwise to code as per 1 string. Using bit sting as basic unit to divide the said test data for counting length of the bit string code table of adaptive variable length compression method is utilized to convert bit string length into code word to achieve data compression. The decoding method uses decoding unit organized with adaptive variable length compression method to carry on decoding.

Description

technical field [0001] The invention belongs to the technical field of integrated circuit testing. Background technique [0002] One of the most critical issues in SOC-System On Chip testing is the problem that the huge and lengthy test data volume affects the test efficiency. Usually, a system-on-chip includes multiple IP (Intellectual Property) cores, and each of these cores requires a large number of test vectors for testing. Such a test data volume will not only exceed the storage space and the number of channels that general commercial automatic test instruments can provide, but also greatly extend the test time. The cost of test equipment and test time are one of the key factors that directly affect the test cost. The test time is generally determined by the following factors: the amount of test data; the data transfer rate from the test instrument to the module under test; and the maximum scan chain length. For a certain test instrument, its test channel capacity a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28H03M7/46
Inventor 孙义和徐磊陈弘毅高力立
Owner TSINGHUA UNIV
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