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Colour Picture tube electron beam arrangement measuring method and device

A technology of color picture tube and testing method, applied in the field of electron beam arrangement test and device of color picture tube, can solve the problems of low precision, failure to take into account the distortion of electron beam shape, time-consuming and labor-intensive, etc., so as to improve the measurement accuracy, and the measurement process is fast and efficient. , good effect

Inactive Publication Date: 2004-09-15
CAIHONG GRP ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the black background arrangement of the fluorescent screen has been automatically measured by computer, but because the electron beam arrangement is hidden under the black background, it still needs to be measured with a microscope and supplemented by a degausser disturbance method, which is time-consuming and laborious, and the accuracy is not high. Therefore, Needs to be improved
Existing testers for color tube electron beam landing tests are based on the full open and full close of the light spot brightness, and automatic measurement with a computer has not been realized. Therefore, the shape distortion of the electron beam is not considered, and the test accuracy is affected.

Method used

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  • Colour Picture tube electron beam arrangement measuring method and device
  • Colour Picture tube electron beam arrangement measuring method and device
  • Colour Picture tube electron beam arrangement measuring method and device

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Embodiment Construction

[0023] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0024] refer to figure 1 The main flow chart of the color picture tube electron beam arrangement test method of the color picture tube, at first the convergence and landing of the color picture tube fluorescent screen 4 to be tested are adjusted to a normal state; Image capture, the computer calculates the size of the offset of the electron beam 3 according to the captured image, the computer automatically controls the increase or decrease of the electromagnetic disturbance current, and then performs electromagnetic disturbance; when the electromagnetic disturbance reaches a certain amount, the electron beam 3 It is located in the middle of the black matrix 1 of the fluorescent screen and appears in the fluorescent powder strips 2 on both sides of the black matrix. At this time, the camera probe 5 reads the electron beam arrangement image displayed in the flu...

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Abstract

In the invention, assortment image of electron beam on screen of color tube to be tested is read into computer 6. Using electromagnet disturbance and sampling recognizes typical spacing interval of group of electron beam, and calculates out assortment converging and dispersing factor of electron beam. Working principle is as follows. After electron beam of screen 4 is affected by magneto turbulence, image of spots of outer contour appeared between phosphor strips are taken into computer 6 by using camera probe 5 with electromagnetism 7. Computer analyzes brightness on section and calculates typical spacing interval values of a, b as well as assortment factor of electron beam. The invention can test and calculate assortment value, providing features of fast measuring procedure and high reassuring accuracy.

Description

technical field [0001] The invention relates to a method and a device for testing the arrangement of electron beams of a color picture tube, in particular to a method and a device for testing the arrangement of electron beams of a color picture tube by using computer image processing technology. Background technique [0002] Existing color picture tube arrangement test whether it is electron beam or fluorescent screen black matrix arrangement, is all manually measured with microscope. At present, the black background arrangement of the fluorescent screen has been automatically measured by computer, but because the electron beam arrangement is hidden under the black background, it still needs to be measured with a microscope and supplemented by a degausser disturbance method, which is time-consuming and laborious, and the accuracy is not high. Therefore, Needs to be improved. Existing testers for color tube electron beam landing tests are based on the full open and full clos...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J9/42
Inventor 李勇军费民权鲁小平赵军
Owner CAIHONG GRP ELECTRONICS CO LTD