Unlock instant, AI-driven research and patent intelligence for your innovation.

Memory having shielding effect

A technology of shielding effect and memory, which is applied in the field of memory, and can solve problems that affect reading accuracy and leakage current generation

Inactive Publication Date: 2005-01-19
MACRONIX INT CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the voltage difference between nodes N1 and N2, there is a leakage current, which affects the correctness of reading

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Memory having shielding effect
  • Memory having shielding effect
  • Memory having shielding effect

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] Please refer to Figure 2A , which represents an equivalent circuit diagram of a semiconductor memory with shielding effect according to a preferred embodiment of the present invention. The memory includes a plurality of memory cell columns (memory cell columns) C connected to adjacent sub-bit lines. Each memory cell column C includes (m+1) memory cells, and is respectively enabled according to the word lines WL0-WLm, wherein m is a positive integer. Each storage unit is used to store 0 or 1 data. Each memory cell can be a transistor, which is given a different threshold voltage Vt according to the data stored in the manufacturing process. The block word line BWL enables the memory block by controlling the switches MB1-MB7. Whether the main bit lines SB0 , SB1 and SB2 are electrically connected to the sense amplifier control unit 130 is determined by the switches MS0 , MS1 and MS2 respectively. The switches MS0 , MS1 and MS are respectively controlled by the control...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

It is a kind of semiconductor memory that has the screening effect. It consists of multiple character wires, grounding wire control unit and multiple storage units. The storage unit consists of master wire, grounding wire, the first equivalent switch and the second equivalent switch. The master wire is activated by a control signal. The grounding wire connects with the grounding wire control unit. The first equivalent switch connects with the master wire and grounding wire and is controlled by the control signal of the previous storage unit. The second equivalent switch connects with the master wire and the grounding line of the next storage unit and is controlled by the control signal of the next storage unit.

Description

technical field [0001] The present invention relates to a memory, and in particular to a memory with shielding effect. Background technique [0002] Figure 1A Shown is the equivalent circuit diagram of a conventional read-only memory. The memory includes a plurality of memory cell columns (memory cell columns) C connected to adjacent sub-bit lines. Each memory cell column C includes (m+1) memory cells, and is respectively enabled according to the word lines WL0-WLm, wherein m is a positive integer. Each storage unit is used to store 0 or 1 data. Each memory cell can be a transistor, which is given a different threshold voltage Vt according to the data stored in the manufacturing process. The block word line BWL enables the memory block by controlling the switches MB1-MB7. Whether the main bit lines SB0 , SB1 and SB2 are electrically connected to the sense amplifier control unit 130 is determined by the switches MS0 , MS1 and MS2 respectively. The switches MS0 , MS1 and...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G11C17/00G11C17/12H10B20/00
Inventor 李文杰陈张庭
Owner MACRONIX INT CO LTD