Full aperture light intensity measuring instrument

A full-caliber, measuring instrument technology, applied in the field of light intensity measuring instruments, can solve the problems of low measurement accuracy, complicated operation, and inability to reflect subtle changes, etc., to overcome low spatial resolution, improve measurement accuracy, and high sensitivity Effect

A full-caliber, measuring instrument technology, applied in the field of light intensity measuring instruments, can solve the problems of low measurement accuracy, complicated operation, and inability to reflect subtle changes, etc., to overcome low spatial resolution, improve measurement accuracy, and high sensitivity Effect

CN1731112AInactive Publication Date: 2006-02-08INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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  • Full aperture light intensity measuring instrument
  • Full aperture light intensity measuring instrument
  • Full aperture light intensity measuring instrument

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Experimental program
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Effect test

Embodiment Construction

[0015] Such as figure 1 As shown, the present invention consists of a beam matching system 1 , a filtering system 2 , a two-dimensional array CCD3 and a data acquisition and processing system 4 . The CCD measures the relative distribution of laser energy, while the output is the gray value. Therefore, it is a key technical link to measure the light intensity to study the calibration method of CCD input-output photoelectric conversion characteristics and linear dynamic range. The core technology of the present invention is to convert the two-dimensional intensity distribution of the laser beam into electrical signals by using a two-dimensional surface array CCD, and the data is processed by a computer. It goes through four main processes of data acquisition, noise removal, edge extraction, and grayscale-to-energy conversion in sequence.

[0016] Such as figure 2 As shown, the beam aperture matching system 1 is composed of two confocal lenses, and mainly completes the proport...

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Abstract

The invention relates to a full aperture radiometer which is formed by a light beam matching system, a filtering system, a two-dimensional lattice CCD and a data gather and processing system, wherein the light beam matching system changes the aperture of the tested light beam to the target surface size of the two-dimensional lattice CCD; then the filtering system deposits the diffused light and waves the intensity of the tested light beam to the rage which two-dimensional lattice CCD can measure; two-dimensional lattice CCD can measure the light intensity in the rage of the tested laser amplifier full aperture, which changes the two-dimensional light intensity signal of the filtered laser beam into electric signal by changing the gray scale signal to light intensity and image-aiming; the data gather and processing system adopts the measuring data of the two-dimensional lattice CCD and stores it, computes and outputs the full aperture light intensity, the light intensity evenness and the relevant parameter of the light intensity evenness.

Description

technical field [0001] The invention relates to a light intensity measuring instrument, in particular to a full aperture light intensity measuring instrument. Background technique [0002] Light intensity characteristics mainly include two aspects: the size of the intensity itself and the uniformity of light intensity distribution. For high-power solid-state laser amplifiers, there are two very important indicators closely related to light intensity and light intensity distribution: small signal gain coefficient and uniformity of gain distribution. The size of the small-signal gain coefficient determines the level of the optical intensity capability of the amplifier; the uniformity of the gain distribution has a great impact on the overall output beam quality, including the near-field of the beam and the extractable efficiency of the optical intensity medium energy storage. Gain uniformity is defined as the peak-to-average ratio of small signals at full aperture. [0003] ...

Claims

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Application Information

Patent Timeline
08 Feb 2006
Publication
CN1731112A
IPC
G01J1/00; G01J1/42
Inventors
李恩德; 段海峰