Self-scanning projection measuring device for two-dimensional configuration outline

A measuring device and self-scanning technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of large system structure and motion error, etc., and achieve the effects of short optical path, simple manufacturing, and simple optical noise.

Inactive Publication Date: 2006-03-15
HUAZHONG UNIV OF SCI & TECH
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  • Self-scanning projection measuring device for two-dimensional configuration outline
  • Self-scanning projection measuring device for two-dimensional configuration outline
  • Self-scanning projection measuring device for two-dimensional configuration outline

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[0025] In this embodiment, a laser with a power of mW is used, for example, a semiconductor laser with a wavelength of λ=0.670 μm. The beam expander can be composed of a lens group with a beam expansion factor greater than 10 times, for example, a concave lens with a focal length of -15mm and a convex lens with a focal length of 200mm, and the distance between the lens groups can be fine-tuned. The optical slit is a long slit with a width less than 1 mm and a straightness error of 1 / 10 of the slit width; the optical slit linear scanner can be a pair of rotating shafts. The cylindrical lens assembly can be composed of a cylindrical lens and an imaging lens group. The CCD can be a linear array CCD or an area array CCD.

[0026] The present invention has poor performance in measuring the two-dimensional profile of the same measurement resolution in the length and width directions, but the ratio of the dimensions in the length and width directions is large (>10) and the measureme...

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Abstract

A self ¿C scanning and projecting measurement device of two- dimensional configuration consists of laser, extender lens, light slot, cylindrical lens set, CCD and controller on the same light path in sequence. It is featured as setting light slot on linear scanner for moving said slot along X direction, making light slot length be greater than Y directional width of geometric form section to be measured and making light slot width be less than X directional measurement resolution rate; forming cylindrical lens set by cylindrical lens or cylindrical lens and imaging lens; using controller to control movement and to control collection and process of measurement signal.

Description

technical field [0001] The invention relates to a projection measurement device, in particular to a two-dimensional profile self-scanning projection measurement device with different length and width direction measurement resolutions for back-projected parallel light. Background technique [0002] As a powerful projection imaging measurement tool for obtaining two-dimensional geometric shapes, the two-dimensional profile optical scanning device has been widely used in geometric shape measurement research. In recent years, scholars have conducted a lot of research on this technology, and have been mainly focusing on two-dimensional contour scanning devices with the same measurement resolution in the length and width directions. [0003] A typical two-dimensional profile projection imaging measurement method is proposed in the article "Detection Method of Car Lamp Contact Sheet" (see "Optical Instruments", 1998, 20(2): 3-7). It is characterized by using an area array CCD (cha...

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Application Information

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IPC IPC(8): G01B11/25
Inventor 张新宝
Owner HUAZHONG UNIV OF SCI & TECH
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