Self-scanning projection measuring device for two-dimensional configuration outline
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- HUAZHONG UNIV OF SCI & TECH
- Publication Date
- 2006-03-15
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to a projection measurement device, in particular to a two-dimensional profile self-scanning projection measurement device with different length and width direction measurement resolutions for back-projected parallel light. Background technique
[0002] As a powerful projection imaging measurement tool for obtaining two-dimensional geometric shapes, the two-dimensional profile optical scanning device has been widely used in geometric shape measurement research. In recent years, scholars have conducted a lot of research on this technology, and have been mainly focusing on two-dimensional contour scanning devices with the same measurement resolution in the length and width directions.
[0003] A typical two-dimensional profile projection imaging measurement method is proposed in the article "Detection Method of Car Lamp Contact Sheet" (see "Optical Instruments", 1998, 20(2): 3-7). It is characterized by using an area array CCD (cha...