Reliability estimating method for gallium arsenide one-chip microwave integrated circuit

A microwave integrated circuit, gallium arsenide technology, applied in the direction of electronic circuit testing, electrical digital data processing, special data processing applications, etc.

Active Publication Date: 2006-10-25
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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  • Application Information

AI Technical Summary

Problems solved by technology

However, there is currently no technique for quantitative reliability prediction of GaAs monolithic microwave integrated circuits

Method used

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  • Reliability estimating method for gallium arsenide one-chip microwave integrated circuit

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Embodiment Construction

[0018] see figure 1 , the method for evaluating the reliability of the gallium arsenide monolithic microwave integrated circuit of the present invention comprises the following steps:

[0019] (1) On the basis of analyzing the characteristics of GaAs monolithic microwave integrated circuits, the main failure modes and their influence degree, a preliminary mathematical model for predicting the reliability of GaAs monolithic microwave integrated circuits is established;

[0020] (2) Carry out reliability tests, collect and analyze the test data, process data and field data of GaAs monolithic microwave integrated circuits, and obtain the model coefficients in the reliability prediction model;

[0021] (3) GaAs monolithic microwave integrated circuit reliability prediction model engineering use, through the collection and analysis of piezoelectric gyroscope use information to improve and verify the accuracy of each model coefficient;

[0022] (4) Establish the final reliability p...

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Abstract

The present invention includes analysing gallium arsenide monolithic microwave integrated circuit, thereby obtaining chip concerned rate of failures and package and external environment concerned rate of failures; according to chip concerned rate of failures and package and external environment concerned rate of failures sum to evaluate gallium arsenide monolithic microwave integrated circuit degree of reliability. The present invention provides guideline for gallium arsenide monolithic microwave integrated circuit rate of failures level and reliability evaluating.

Description

technical field [0001] The invention relates to gallium arsenide monolithic microwave integrated circuit technology, in particular to a method for evaluating the reliability of gallium arsenide monolithic microwave integrated circuits based on mathematical statistics and failure physics. Background technique [0002] Monolithic Microwave Integrated Circuits (MMIC) are passive and active components prepared on a semi-insulating semiconductor substrate by epitaxy, implantation, photolithography, evaporation, sputtering, etc., and connected to form a microwave (even Millimeter wave) frequency band functional circuit. It includes all monolithic integrated circuit chips and their packages that can realize digital and analog functions in the range of 1-300GHz, and its frequency range can even be extended to the entire radio frequency range. Due to the high electron mobility, wide band gap, wide operating temperature range, and good microwave transmission performance of gallium ar...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G01R31/28H01L21/66
Inventor 莫郁薇
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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