Test method and device for repeated nanosecond pulse medium breakdown characteristic

A technology of repetition frequency and nanosecond pulse, which is applied in the direction of material breakdown voltage and dielectric strength test, can solve the problem of dielectric breakdown characteristics under the lack of repetition frequency nanosecond pulse, and achieve the effect of convenient and simple measurement

Inactive Publication Date: 2007-04-11
INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
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Problems solved by technology

In recent years, domestic institutions such as China Academy of Engineering Physics, Northwest Institute of Nuclear Technology, Institute of Electrical Engineering, Chinese Academy of Sciences, and Tsinghua University ha

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  • Test method and device for repeated nanosecond pulse medium breakdown characteristic
  • Test method and device for repeated nanosecond pulse medium breakdown characteristic
  • Test method and device for repeated nanosecond pulse medium breakdown characteristic

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Embodiment Construction

[0013] As shown in Figure 1, the experimental device of the present invention includes a repetition frequency nanosecond pulse power supply 1, a pulse generator 2, a protective resistor 3, an experimental cavity 4, a current measurement sensor 5, a voltage measurement sensor 6, and a broadband high-speed digital storage oscilloscope 7,8 , Microcomputer 9. The output of the pulse generator 2 is respectively connected to the repetition frequency nanosecond pulse power supply 1 and the oscilloscope 8, the output terminal of the pulse power supply 1 is respectively connected to the voltage measurement sensor 5 and the protection resistor 3, and the other end of the protection resistor 3 is connected to the experimental chamber 4, and the experimental chamber The output of 4 is connected to the current measuring sensor 5 and then grounded, the signal output ends of the current measuring sensor 5 and the voltage measuring sensor 6 are connected to the oscilloscope 7 through an equal-...

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Abstract

The present invention is test method and device for repeated nanosecond pulse medium breakdown characteristic. After determining the output voltage of pulse power source and regulating the gap between breakdown electrodes, the pulse generator sends out the enabling pulse, the pulse power source outputs repeated high voltage pulses, the oscilloscope is triggered and one channel is broken down. After certain tolerance time, the gap between breakdown electrodes is broken down, the voltage sensor and the current sensor detect the breakdown voltage and the breakdown current, and the oscilloscope records the breakdown voltage signal and the breakdown current signal. Then, the oscilloscope sends out one low level signal through its TTL logic port, one other measuring channel of the oscilloscope detects the signal while the outer trigger port of the pulse generator receives the signal for automatic shut off, and the voltage, current and tolerance time signals are measured.

Description

technical field [0001] The invention relates to an experimental method and device for breakdown characteristics of an insulating medium under repetition frequency nanosecond pulses, in particular to an experimental method and device for gas dielectric breakdown characteristics under nanosecond high-voltage pulses. Background technique [0002] Considerable research has been done on the breakdown characteristics of gases, liquids and solid dielectrics under conventional conditions such as direct current, power frequency alternating current and lightning wave shock pulses. In recent years, the properties of dielectric materials under unconventional conditions, high-voltage insulation technology, and gas discharge laws in different forms and conditions have attracted research attention at home and abroad, especially the breakdown characteristics under narrow pulses are a research hotspot. The research on dielectric breakdown characteristics under extreme conditions such as nano...

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Application Information

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IPC IPC(8): G01N27/92G01R31/12
Inventor 邵涛孙广生严萍袁伟群王珏张适昌
Owner INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
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