Portable multi-channel photoelectronic chip detection signal generating device and detection method

Abstract

The invention relates to a mobile multichannel photo-electron chip testing signal generating device that includes keyboard input section, input signal buffer circuit, input / output state indicating circuit, multichannel photo-electron selecting circuit, state matrix assurance circuit, multichannel photo-electron chip driving circuit, output signal buffer circuit, and output signal and tested multichannel photo-electron chip electricity interface. It includes the following steps: keyboard designing the route selecting code, reading input signal buffer circuit, route selecting state indicating circuit reading data from buffer circuit, route selecting state display driving signal; state matrix confirming circuit selecting the working state of control unit.

Description

technical field [0001] The invention relates to a test signal generating device of a portable semiconductor optoelectronic device, in particular to a test signal generating device capable of simultaneously detecting characteristic parameters of multiple multi-channel optoelectronic chips. Background technique [0002] Dense Wavelength Division Multiplexing (DWDM) technology is an effective method to solve broadband and large-capacity optical fiber network communication. Multi-channel optoelectronic chip is the key component of constructing DWDM system. In the research, production and application of multi-channel optoelectronic chips, a specific detection equipment is needed, which can simultaneously detect various optical and electrical comprehensive characteristic parameters of each port of multi-channel optoelectronic chips, and can also have high High detection efficiency, simple operation, easy to carry, suitable for ordinary operators and quick maintenance. According ...

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Problems solved by technology

The testing devices currently used mainly have the following defects: first, the equipment is bulky and not easy to carry, especially inconvenient for quick repair of faults in practical applications; second, the operation is complicated, requiring high optical and electrical knowledge to correctly measure the required The third is that the judgment of the optical path must be done by manual calculation, which is not suitable for the test of large-scale multi-channel chips; the fourth is that the test process requires expensive signal generators, and these devices are very expensive and have high requirements for the test environment. also very high

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