Method and system for non-destructive evaluation of conducting structures
Inactive Publication Date: 2005-12-08
INTELLIGENT AUTOMATION
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[0011] Some of the advantages of the present invention over the prior art include use of the present invention for testing any structure which is conducting to any extent at high frequencies such as, for example, wiring, piping, fencing and circuitry, use of the present invention for testing chlorine level and pH level in water and other fluids, use of the present invention for testing for fluid
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An integrator is used to measure the average value of the impulse response; and, accordingly, the Boot
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[0022] It is known that cross-correlation of test input and output signals supplied to and received from a device under test contain sufficient information to evaluate the integrity of the device. It is an important feature of the present invention that the cross-correlation can be accomplished without acquiring the input and output signal voltages directly and without fast digitization of the input and output signals. To this end, in accordance with the present invention, the test input signal (or replica thereof) is delayed and supplied to an analog (voltage) multiplier along with the output signal such that the output of the multiplier represents the time-averaged correlation function for a particular input-output leg. The multiplier output can be digitized at a reduced speed due to the interest in time-averaged signals.
[0023] A preferred embodiment of a system according to the present invention is shown in FIG. 1 for testing a conducting structure 100 wherein a PRBS test signal...
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Abstract
Method and system for non-destructive evaluation for a conducting structure by measuring the electrical impulse response thereof including applying a PRBS test input signal to the conducting structure, detecting an output signal from the conducting structure and processing the data to assess the condition of the conducting structure via changes in the electrical impulse response and to locate any defects along the conducting structure.
Description
BACKGROUND OF THE INVENTION [0001] The present invention pertains to methods and systems for evaluating the structural integrity of electrically conductive structures and, more particularly, to such methods and systems wherein the electrical impulse response of the structure is measured after a test input signal is applied in order to assess the integrity of the structure and the presence, severity and location of any defects. [0002] The prior art, as exemplified by U.S. Pat. No. 3,988,667 to Roth et al, U.S. Pat. No. 4,067,060 to Poussart et al, U.S. Pat. No. 4,275,446 to Blaess, U.S. Pat. No. 4,935,699 to Boenning, U.S. Pat. No. 4,988,949 to Boenning et al, U.S. Pat. No. 5,025,221 to Blaess, U.S. Pat. No. 6,064,212 to Ariweilar et al and U.S. Pat. No. 6,265,880 to Bomet et al and British Patent No. 1,160,271 to Booth et al, discloses the use of periodic-random, noise and pseudo-random binary sequence test input signals for measuring transfer functions of systems under test, and / or...
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