Illumination system for a microlithography projection exposure apparatus
Patent Information
- Authority / Receiving Office
- US · United States
- Current Assignee / Owner
- CARL ZEISS SMT GMBH
- Publication Date
- 2006-06-15
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
[0001] This application is a Continuation of International Patent Application PCT / EP2004 / 004875 filed on May 7, 2004, and claiming priority from German Patent Application DE 103 22 393.2 filed on May 12, 2003. Priority is claimed from German Patent Application DE 103 22 393.2 filed on May 12, 2003. The complete disclosure of these patent applications is incorporated into this application by reference.BACKGROUND OF THE INVENTION
[0002] 1. Field of the Invention
[0003] The invention relates to an illumination system for a microlithography projection exposure apparatus for illuminating an illumination field with illumination radiation with a predeterminable degree of coherence.
[0004] 2. Description of the Related Art
[0005] The performance of projection exposure apparatuses for the microlithographic fabrication of semiconductor components and other finely patterned devices is substantially determined by the imaging properties of the projection objectives. Furthermore, the image qualit...