Three-dimensional measurement device and three-dimensional measurement method
Patent Information
- Authority / Receiving Office
- US · United States
- Patent Type
- Applications(United States)
- Current Assignee / Owner
- MINOLTA CO LTD
- Publication Date
- 2006-06-15
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
RELATED APPLICATION
[0001] This application is based on Patent Application No. 2000-155768 filed in Japan, the entire content of which is hereby incorporated by reference. BACKGROUND OF THE INVENTION
[0002] 1. Field of the Invention
[0003] The present invention relates to a three-dimensional measurement method and device for obtaining position information of an object by projecting light and receiving the light reflected from the object.
[0004] 2. Description of the Related Art
[0005] Three-dimensional measurement can be accomplished using the time of flight (TOF) from the moment of light pulse transmission to the reception of the returning light pulse reflected by an object since this TOF is dependent on distance.
[0006] Japanese Laid-Open Patent Application No. H11-508371 discloses a device using a solid state area sensor as a photoreceptor device for modulating light entering the solid state area sensor by a photoelectric modulator. The distance is reflected in the amount of expo...