Gas supply system, substrate processing apparatus and gas supply method

a substrate processing and gas supply technology, applied in non-linear optics, instruments, transportation and packaging, etc., can solve the problems of increasing the burden of control, requiring a large space for the lines, and the inability etc., to achieve the desired in-surface uniformity, simple line configuration, and simple control operation

Inactive Publication Date: 2007-08-02
TOKYO ELECTRON LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0009]It is, therefore, an object of the present invention to provide a gas supply system and the like, capable of achieving a desired in-s...

Problems solved by technology

Accordingly, a line configuration and a flow rate control in each of the lines become complicated, which results in requiring a large space for the lines and an increased burden of control.
Further, even if the gases can be supplied from plural portions in the processing ch...

Method used

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  • Gas supply system, substrate processing apparatus and gas supply method
  • Gas supply system, substrate processing apparatus and gas supply method
  • Gas supply system, substrate processing apparatus and gas supply method

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Embodiment Construction

[0062]Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. Like reference numerals will be given to like parts having substantially the same functions, and redundant description thereof will be omitted in the specification and the accompanying drawings.

[0063](Configuration Example of Substrate Processing Apparatus)

[0064]First of all, a substrate processing apparatus in accordance with an embodiment of the present invention will be described with reference to FIG. 1. FIG. 1 is a cross sectional view showing a schematic configuration of the substrate processing apparatus in accordance with the embodiment of the present invention. Herein, the substrate processing apparatus is configured as a parallel plate type plasma etching apparatus.

[0065]Such a substrate processing apparatus 100 includes a processing chamber 110 formed of a substantially cylindrical processing vessel. The processing vessel is made of aluminum all...

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Abstract

A gas supply system for supplying a gas into a processing chamber for processing a substrate to be processed includes: a processing gas supply unit; a processing gas supply line; a first and a second processing gas branch line; a branch flow control unit; an additional gas supply unit; an additional gas supply line; a first and a second additional gas branch line; a flow path switching unit; and a control unit. Before processing the substrate to be processed, the control unit performs a pressure ratio control on the branch flow control unit while the processing gas supply unit supplies the processing gas. After the inner pressures of the first and the second processing gas branch line become stable, the control unit switches the pressure ratio control to a fixed pressure control, and then the additional gas supply unit supplies the additional gas.

Description

FIELD OF THE INVENTION [0001]The present invention relates to a gas supply system for supplying a gas into a processing chamber, a substrate processing apparatus and a gas supply method.BACKGROUND OF THE INVENTION [0002]A substrate processing apparatus is configured to perform specific processes such as a film forming process, an etching process and the like on a substrate to be processed (hereinafter, simply referred to as “substrate”) such as a semiconductor wafer, a liquid crystal substrate or the like.[0003]As for such a substrate processing apparatus, there has been known a plasma processing apparatus, for example. The plasma processing apparatus includes, inside a processing chamber, a lower electrode serving also as a mounting table for mounting thereon a substrate and an upper electrode serving also as a shower head for injecting a gas toward the substrate. Such a parallel plate type plasma processing apparatus is configured to perform specific processes such as a film formi...

Claims

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Application Information

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IPC IPC(8): C23C16/00B05C11/00H01L21/306
CPCC23C16/45561C23C16/455Y10T137/0318Y10T137/877H01L21/67017C23C16/45536C23C16/45502G02F1/1303
Inventor MIZUSAWA, KENETSU
Owner TOKYO ELECTRON LTD
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