Frequency measuring and control apparatus with integrated parallel synchronized oscillators

a technology of parallel synchronized oscillators and frequency measuring and control apparatus, which is applied in the direction of scanning probe techniques, frequency to phase shift conversion, instruments, etc., can solve the problems of inability to run cantilever excitation and pll detection at harmonic frequencies, inability to handle constant frequency changes very well, and considerable cost of configuration for each additional lock-in
US20150101086A1Inactive Publication Date: 2015-04-09RHK TECH
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Applications(United States)
Current Assignee / Owner
RHK TECH
Publication Date
2015-04-09
Estimated Expiration
Not applicable · inactive patent

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Abstract

A frequency measuring and control apparatus includes a plurality of synchronized oscillators integrated in parallel into one programmable logic device.
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Description

CROSS-REFERENCE TO RELATED APPLICATION

[0001] This present application claims priority from U.S. patent application Ser. No. 13 / 583,952 filed on Sep. 11, 2012, PCT Patent Application PCT / US2011 / 28859 filed on Mar. 17, 2011, and U.S. Provisional Patent Application No. 61 / 315,823 filed Mar. 19, 2010, all of which are incorporated herein by reference in their entireties.TECHNICAL FIELD

[0002] This disclosure relates generally to frequency measuring and control and, more particularly, to frequency control with phase locking.BACKGROUND

[0003] Many technologies employ phase locked loops (PLLs). For example, in scanning probe microscopy, scientists use scanning probe microscopes (SPMs) to reveal data about various properties of materials, like gold or silicon, at very fine resolution down to molecules and atoms of the materials. SPMs are a family of ultra-high magnification instruments that include Scanning Tunneling Microscopes (STMs), Atomic Force Microscopes (AFMs), Near Field Scanning Optica...

Claims

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