Reflectivity measuring system

Abstract

A reflectance measurement system used to measure the reflectivity of a surface of an object to be measured, which includes a light source, a polarization-maintaining fiber, a polarization-maintaining fiber directional coupler, a first spectrometer, a second spectrometer, and a A first detector, a second detector and a signal processing unit. The light source is an unpolarized light source. The polarization-maintaining optical fiber directional coupler includes a light incident end, a light exit end, a measurement end and a reference light output end. , the light incident end is connected to the polarization maintaining optical fiber. One end of the first spectrometer is connected to the light exit end of the polarization-maintaining fiber directional coupler, and the other end is connected to the end of the second detector; one end of the second spectrometer is connected to the polarization-maintaining fiber directional coupler. The reference light output end is connected, the other end is connected to one end of the first detector, the other ends of the first detector and the second detector are both connected to the signal processing unit, and the measurement end is aligned with the surface of the object to be measured. This reflectance measurement system can accurately measure the reflectance of the surface of the object to be measured, especially the reflectance of curved surfaces.

Description

【Technical field】 [0001] The invention relates to a reflectivity measurement system, in particular to a reflectivity measurement system in which the surface of an object to be measured is a curved surface. 【Background technique】 [0002] An existing reflectance measurement system, as disclosed in U.S. Patent No. 4,831,276 published on May 16, 1989, the light emitted by the light source is focused into a beam of parallel light through a series of lenses and a contracted aperture, and then reflected by a mirror and After being focused to a point by the lens, it reaches the surface to be measured, is reflected by the surface to be measured, passes through some optical components, and then reaches the signal processing unit, thereby obtaining the reflectivity of the surface to be measured. The disadvantage of this measurement system is that it includes many optical components, and the structure is more complex; the optical path assembly of separate components is used to collect ...

AI Technical Summary

Problems solved by technology

The disadvantage of this measurement system is that it includes many optical components, and the structure is more complex; the optical path assembly of separate components is used to collect light, which is difficult to assemble and not easy to align the light; in addition, due to the polarization dependence of the incident light, it is easy to cause Measurement error; the optical path assembly of the separated components prevents the spot size of the incident light from being reduced to a small size, causing different incident angles when it hits a curved surface to be measured, resulting in measurement errors; the system has no compensation device, The system error cannot be compensated and the error can be reduced

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