Memory error-detecting and error-correcting coding circuit and method for reading and writing data utilizing the same

A memory reading and error correction coding technology, applied in static memory, instruments, etc., can solve problems such as data errors, voltage fluctuations, and temperature rises
CN101067972AActive Publication Date: 2007-11-07GIGADEVICE SEMICON (BEIJING) INC

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
GIGADEVICE SEMICON (BEIJING) INC
Publication Date
2007-11-07

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Abstract

This invention relates to an error-check and error-correction code circuit for storages and a method for reading and writing data by it taking matrix G as a logic core including: a decoding process and a coding process and a method for writing in data by this method. Apart from a decoding process and an error correction process, it also includes a coding process, and finally puts forward an error check and correction and coding circuit for realizing said two methods including a decoder, an error-correction circuit, a coding circuit, an interface circuit and related data transmission circuit so as to simplify layout of bottom circuit and speed up operation speed of circuits.
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Description

technical field

[0001] The present invention relates to a method for implementing ECC in a storage device, in particular to a method for reading data from a memory for error detection and correction, and a method for processing data written into memory by using the above method, and finally to realize the above-mentioned The circuit structures corresponding to the two methods. Background technique

[0002] With the development of integrated circuits, memory cells will occupy most of the chip area. Storage performance has a great impact on chip performance, so it is necessary to ensure 100% accuracy of stored data. However, any memory is faced with the challenges of reliability and yield, such as the decrease of signal-to-noise ratio with the increase of integration density; soft errors caused by cosmic rays to memory cells; process deviation and material defects lead to lower memory yield, etc. Wait. Therefore, an effective method is needed to solve these problems. [00...

Claims

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