Memory error-detecting and error-correcting coding circuit and method for reading and writing data utilizing the same
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- GIGADEVICE SEMICON (BEIJING) INC
- Publication Date
- 2007-11-07
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Abstract
Description
technical field
[0001] The present invention relates to a method for implementing ECC in a storage device, in particular to a method for reading data from a memory for error detection and correction, and a method for processing data written into memory by using the above method, and finally to realize the above-mentioned The circuit structures corresponding to the two methods. Background technique
[0002] With the development of integrated circuits, memory cells will occupy most of the chip area. Storage performance has a great impact on chip performance, so it is necessary to ensure 100% accuracy of stored data. However, any memory is faced with the challenges of reliability and yield, such as the decrease of signal-to-noise ratio with the increase of integration density; soft errors caused by cosmic rays to memory cells; process deviation and material defects lead to lower memory yield, etc. Wait. Therefore, an effective method is needed to solve these problems. [00...