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Conveying calibration device and wafer transmission system using the same

A technology of a wafer transfer system and a calibration device, which is applied in the directions of transportation and packaging, conveyor objects, furnaces, etc., can solve the problems of not being able to define the position of the wafer notch, affecting the reliability of wafer transfer, and increasing chip edge damage, etc. Production transfer efficiency, reliable handling, accurate calibration results

Active Publication Date: 2008-04-02
BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
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AI Technical Summary

Problems solved by technology

However, due to the mechanical clamping of the edge of the wafer, and the wafer is thin and brittle, the possibility of damage to the edge of the wafer due to force is increased during the clamping process, which reduces reliability
[0012] Each of the above three methods has its own advantages and disadvantages, all of which have a certain impact on the reliability of wafer transmission. Moreover, they have a common disadvantage, that is, they cannot correct the calibration of wafer eccentricity and wafer notch. Definition of location
Therefore, in all three methods, a wafer aligner must be installed in the entire transmission system. Before the atmospheric / vacuum manipulator transports the wafer into the process reaction chamber for semiconductor processing, the target wafer must be sent to the wafer aligner for calibration and definition. The transfer process is too complicated

Method used

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  • Conveying calibration device and wafer transmission system using the same
  • Conveying calibration device and wafer transmission system using the same
  • Conveying calibration device and wafer transmission system using the same

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Embodiment Construction

[0051] The preferred specific implementation of the handling and calibration device of the present invention is shown in Figure 8, including an end effector, the rear end of the end effector is connected to the mechanical arm 5, and the front end is provided with a picker for grabbing objects. The rear end of the actuator is hinged to the mechanical arm 5, and other connection methods can also be used as required.

[0052] There are two end effectors, respectively the first end effector 1 and the second end effector 3, the rear ends of the first end effector 1 and the second end effector 3 are respectively It is hinged with the mechanical arm 5 and can rotate around the hinge point independently; the front end is respectively connected with the first object fetcher 2 and the second object fetcher 4 .

[0053] As shown in FIG. 9 , the first object fetcher 2 and the second object fetcher 4 are respectively provided with an object retrieval groove 8 , and the two work together to...

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Abstract

The present invention discloses a transportation calibration device and a crystal wafer transmission system applying the same, comprising a terminal effector, wherein, the back end of the terminal effector is articulated with a manipulator, and the front end of the terminal effector is provided with a fetching device used to grab objects; the present invention also comprises a driving device which can drive the terminal effector to rotate around an articulated point and a calibration device used to position and calibrate a grabbed object; a fetching groove is arranged on the fetching device; the lower part of the fetching groove is provided with a positioning plane used for the center positioning to the grabbed object; a calibrator is arranged on the manipulator, which is used to define the circumferential angle of the grabbed object. The present invention is mainly used for a crystal wafer transmission system in the manufacturing process of semiconductor crystal wafers to transmit and calibrate the crystal wafers, is reliable in transportation, accurate in calibration, can be applied to both atmospheric environment and vacuum environment, cancels the transmission process of delivering the crystal wafers to the crystal wafer calibrator, reduces transmission path and time, improves the efficiency of production as well as transmission, and simplifies system equipment.

Description

technical field [0001] The invention relates to a semiconductor processing equipment, in particular to a transport calibration device and a wafer transmission system using the device. Background technique [0002] In the process of semiconductor processing, the wafer needs to be processed from the wafer chamber to the process reaction chamber. After the process is completed, the wafer is transferred back from the process reaction chamber to the wafer chamber. In the whole process, the atmospheric manipulator and the vacuum manipulator are the exercising parts and core components of the wafer transfer function, the central nerve of the wafer transfer system, and play the role of a transportation hub. [0003] As shown in Figure 1, it is the transmission process of wafers with a thickness of 200 mm or less; [0004] As shown in Figure 2, it is the transfer process of 300 mm wafer. [0005] It can be seen that in every link of wafer transfer and handling, the atmospheric / vacu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/677H01L21/68B65G47/90B65G49/07
Inventor 张之山
Owner BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
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