Conveying calibration device and wafer transmission system using the same
A technology of a wafer transfer system and a calibration device, which is applied in the directions of transportation and packaging, conveyor objects, furnaces, etc., can solve the problems of inability to define the position of the wafer notch, increase the damage of the wafer edge, and the complicated transfer process, so as to improve the production transfer. Efficiency, accurate calibration, and the effect of simplifying system equipment
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[0051] A preferred embodiment of the handling and calibrating device of the present invention is as follows: Figure 8As shown, including the end effector, the rear end of the end effector is connected with the mechanical arm 5, and the front end is provided with a picker for grabbing objects. The rear end of the end effector is hinged with the mechanical arm 5, according to Other connection methods can also be used if necessary.
[0052] There are two end effectors, respectively the first end effector 1 and the second end effector 3, the rear ends of the first end effector 1 and the second end effector 3 are respectively It is hinged with the mechanical arm 5 and can rotate around the hinge point independently; the front end is respectively connected with the first object fetcher 2 and the second object fetcher 4 .
[0053] Such as Figure 9 As shown, the first object fetcher 2 and the second object fetcher 4 are respectively provided with an object retrieval groove 8, and ...
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