Method and device for eliminating energy jitter of electronic microscope electron energy loss spectrum

An electron energy loss, electron microscope technology, applied in the field of energy spectrum measurement analysis and microscopic analysis, can solve the problems of difficulty in taking into account the interference of different frequencies, the feedback loop does not have universal applicability, etc., to achieve the effect of fixed narrowband frequency interference suppression

Inactive Publication Date: 2008-07-30
TSINGHUA UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0011] The feature of the above method is to perform energy feedback on the interference signal of the whole frequency band, so it is difficult to take into account the interference of different frequencies. It is necessary to design the feedback loop to adjust the feedback gain to eliminate the interference of different frequencies.
In addition, external disturbances have time-varying characteristics, and the designed feedback loop does not have universal applicability

Method used

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  • Method and device for eliminating energy jitter of electronic microscope electron energy loss spectrum
  • Method and device for eliminating energy jitter of electronic microscope electron energy loss spectrum
  • Method and device for eliminating energy jitter of electronic microscope electron energy loss spectrum

Examples

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Embodiment 1

[0037] Please see Figure 1-5, this embodiment is realized through the following steps:

[0038] Step 1, after the electron energy analyzer 2 (Gatan 607serial EELS) placed behind the lens barrel of the electron microscope 1 receives the electron beam emitted by the electron microscope 1, the electron beam is deflected by 90° through the magnetic prism 14 inside the electron energy analyzer 2 , emitted from the exit of the electron energy analyzer 2, this part of the electron beam is received by the fast response energy spectrum detector 3 (DM0045C Photodetector module with9113B, Electron Tubes Ltd.) in a serial manner. For a detailed description, refer to the serial mode receiving part of the Chinese patent application with application number 200510086736.6. The line detector of the fast-response energy spectrum detector 3 is a tungsten wire, and the tungsten wire is located at the exit of the energy analyzer 2 to receive the emitted electron energy. The tungsten wire receives...

Embodiment 2

[0061] Step 1 is the same as in Example 1.

[0062] Step 2, the voltage signal output by the fast-response energy spectrum detector in step 1 is input to the drift detection module 5 through the input interface module 4, and the drift detection module 5 is an analog cross-correlation function calculator composed of an integral calculator. The output of is the energy spectrum drift.

[0063] Step 3, input the energy spectrum drift in step 2 into the analog adaptive notch filter 6, and simultaneously input the reference signal generated by the signal generator 8 into the aforementioned analog adaptive notch filter 6, and simulate the adaptive notch filter 6 at the same time. The voltage signal output from the notch filter 6 is the pre-measurement.

[0064] The principle of using the analog algorithm to realize the adaptive notch filter 6 is similar to the digital adaptive notch method, and the selected reference signals are two signals related to the interference signal: Csin(2...

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Abstract

The invention provides an energy jitter method eliminating the energy loss spectrum of an electron microscope and the device thereof, and belongs to the energy spectrum measuring analysis and microscopic analysis field. The invention has the method that: an electron energy analyzer arranged at a lens cone of the electron microscope 1 receives electron energy, and then the received electron energy loss spectroscopy obtains the energy spectrum drift quantity by a drift detection module through a serial fast response energy spectrum detector 3, the energy spectrum drift quantity is inputted to a self-adapting limiter 6, the self-adapting limiter 6 obtains the next cycle predictor according to the reference signal provided by a signal generator 8, the predictor is converted and then outputted to a voltage control circuit of an electron beam drift tube 9 or inputted to a high pressure generator of the electron microscope 1 through a high-low voltage separating module 10. Using the method and the device thereof can realize the effective control of the energy jitter under the fixed narrow band frequency jamming appeared possibly in the receiving process of the electron energy loss spectroscopy.

Description

technical field [0001] The invention belongs to the fields of energy spectrum measurement analysis and microanalysis, and in particular relates to an adaptive notch method and device for eliminating energy spectrum drift of electron energy loss spectrum. Background technique [0002] When observing a thin sample with an electron microscope, the incident electrons will interact with the sample in multiple ways, causing the electrons to lose different amounts of energy at certain rates. If the intensity of the emitted electrons is counted on the dispersion plane of the electron energy loss spectrometer according to the amount of energy lost, the electron energy loss spectrum (Electron Energy-Loss Spectrum, abbreviated as EELS) can be obtained. Figure 1 shows the standard electron energy loss Spectrum diagram. Electron energy loss spectroscopy provides a wealth of sample information, such as chemical composition, chemical bonding, and properties of solid structures, electrons,...

Claims

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Application Information

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IPC IPC(8): G01N23/00H01J37/252H01J37/26
CPCH04K3/42
Inventor 袁俊谢琳王志伟
Owner TSINGHUA UNIV
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