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Method for diagnosing soft failure of analog circuit base on modified type BP neural network

A BP neural network and analog circuit technology, which is applied in the field of soft fault diagnosis of analog circuits based on the improved BP neural network, can solve problems such as falling into local optimum, unable to correctly give network performance functions, and low learning efficiency

Inactive Publication Date: 2008-07-30
HUNAN UNIV
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AI Technical Summary

Problems solved by technology

[0005] Sensitivity analysis of the circuit to be tested is an effective method to determine the test nodes and excitation signals of the circuit, but the existing sensitivity analysis has many constraints, such as it can only be used to predict the impact on network performance when there are small changes in network parameters , but cannot correctly give the change of the network performance function when the network parameters have a large change
The weight adjustment of the BP neural network is done through the traditional BP algorithm, which is a gradient-based search algorithm, which usually has the disadvantages of low learning efficiency, slow convergence speed, and easy to fall into local optimum.

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  • Method for diagnosing soft failure of analog circuit base on modified type BP neural network
  • Method for diagnosing soft failure of analog circuit base on modified type BP neural network
  • Method for diagnosing soft failure of analog circuit base on modified type BP neural network

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Embodiment Construction

[0022] The invention is a pattern recognition and diagnosis method, which classifies faults according to test data, so as to achieve the purpose of fault location. Flow chart of the present invention is as shown in Figure 1, and concrete diagnosis process is as follows:

[0023] (1) Selection of fault set: Select several single faults and multiple faults as fault sets according to the characteristics of the circuit under test, past experience and component failure probability.

[0024] (2) Selection of excitation signals and test nodes: In analog circuit fault diagnosis, sensitivity analysis has been widely used in optimizing excitation signals and test nodes, but the traditional sensitivity can only be used for small changes in circuit component parameters. In some cases, it cannot give correct results when the component parameters have changed greatly. Therefore, the present invention proposes a sensitivity analysis method based on random sampling technology, which is not a...

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Abstract

The invention relates to a method which can diagnose the soft fault of an analog circuit based on an improved BP neural network. The method comprises the following steps that: the excitation signal and the test node of the analog circuit are selected by adopting the random sampling technique, then a circuit to be tested is applied with the excitation signal and the voltage value is extracted at the test node, and then through principal component analysis and the normalization processing, the characteristic value of the soft fault is extracted and is taken as a training sample; the BP network is optimized by adopting the immune genetic algorithm; the training sample is input into the optimized BP network to realize the training to the network; the practical measured signal of the circuit to be tested is input into the trained optimal BP neural network after being extracted with fault characteristics, and the output of the network is of a fault type. The invention effectively processes the fault diagnosis difficulty of the analog circuit, which is brought out by the tolerance, and improves the efficiency and the performance of the BP network in the analog circuit fault diagnosis.

Description

technical field [0001] The invention relates to a method for diagnosing a soft fault of an analog circuit, in particular to a method for diagnosing a soft fault of an analog circuit based on an improved BP neural network. Background technique [0002] With the rapid development of the electronics industry, the scale of modern engineering technology systems continues to expand, and electronic products are increasingly large-scale, high-speed, automated and intelligent. People are increasingly aware that the reliability of the electronic system is the guarantee of the stable operation of the system. In many cases, its importance even exceeds the function and performance of the system. In , the analog circuit cannot be completely replaced. According to statistics, the proportion of analog circuits and digital circuits has not changed much over the years, and analog circuits are more prone to failure than digital circuits. Therefore, industrial production has put forward new an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G06N3/02
Inventor 何怡刚祝文姬刘美容阳辉方葛丰谢宏朱彦卿唐志军谭阳红肖迎群
Owner HUNAN UNIV
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