Method for manufacturing thin-film transistor
A technology for thin film transistors and manufacturing methods, which is applied in the fields of semiconductor/solid-state device manufacturing, optics, instruments, etc., and can solve the problems of poor uniformity of critical voltage of components and large differences of components.
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[0031] FIG. 3a and FIG. 3b are schematic diagrams showing the structure of a low-temperature polysilicon panel according to an embodiment of the present invention. In this embodiment, a substrate 30 is first provided, the bottom layer of which is a glass layer 34, a silicon nitride (SiNx) film 33 is sequentially deposited on the glass layer 34, a silicon oxide (SiOx) film 32 and the uppermost layer are An amorphous silicon (a-Si) layer 31 .
[0032] Next, please refer to FIG. 4 which is a schematic diagram of the irradiation area of the panel. The first laser irradiation of the crystal growth technology is performed on the partial area 312 of the substrate 30, that is, laser annealing using the principle of lateral crystal growth, such as sequential lateral crystallization, solid-state laser or Thin-beam Directional X'tallization (TDX), etc. Part of the region 312 is the circuit layout region of the thin film transistor in the subsequent low-temperature polysilicon process....
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