Unlock instant, AI-driven research and patent intelligence for your innovation.

Rigid organic opto-electronic device air tightness calibration method

A technology of optoelectronic devices and calibration methods, which is applied in the direction of liquid tightness measurement using liquid/vacuum degree, can solve the problems of only measuring, not measuring other gases, slow measuring speed, etc., and achieve the effect of improving service life

Inactive Publication Date: 2009-01-07
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Existing methods for measuring the airtightness of organic optoelectronic devices include weighing method (WVP method), calcium film corrosion method and sensor method. Although they are technically easier to implement and have higher sensitivity, they have obvious shortcomings: (1 ) can only measure water vapor permeability, and cannot measure other gases; (2) The measurement speed is slow; (3) It is impossible to measure the outgassing inside the device
[0005] However, when using mass spectrometry to measure and calibrate the impact of gas permeation on organic optoelectronic devices, how to analyze the permeability of different gases to different encapsulated organic optoelectronic devices, so as to aim at the impact of different gases on the performance of organic optoelectronic devices Affects to propose targeted improvement methods, not just limited to the study of the permeability of a certain gas (water vapor, oxygen, carbon dioxide, etc.) relative to a certain material and process
At the same time, the existing airtightness calibration methods are either quite difficult or lack practical operability for the sampling of one or several gases.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Rigid organic opto-electronic device air tightness calibration method
  • Rigid organic opto-electronic device air tightness calibration method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] Oxygen tightness calibration method for rigid organic optoelectronic devices:

[0025] ① Place the organic optoelectronic device to be tested in figure 1 In the package cavity 1 shown;

[0026] ②According to the actual test requirements, by figure 1 The shown gas pipeline 3 feeds oxygen into the packaging cavity 1, and the adjusted pressure of the oxygen is an atmospheric pressure;

[0027] ③ Place the packaged organic optoelectronic device in figure 2 In the shown vacuum cavity 9, and adjust the gas pressure in the vacuum cavity 9, so that the pressure difference between the pressure of oxygen encapsulated in the organic optoelectronic device and the pressure difference in the vacuum cavity is close to the actual use;

[0028] ④ Place the organic optoelectronic device in the vacuum chamber for 30 minutes to 10 hours;

[0029] ⑤ Analyzing the oxygen leaking from the inside of the organic optoelectronic device into the vacuum chamber through a mass spectrometer conn...

Embodiment 2

[0031] Method for Water Vapor Hermeticity Calibration of Rigid Organic Optoelectronic Devices

[0032] ① Place the organic optoelectronic device to be tested in figure 1 In the package cavity 1 shown;

[0033] ②According to the actual test requirements, by Figure 1 The shown gas pipeline 4 feeds water vapor into the packaging cavity 1, and the pressure of the adjusted water vapor is an atmospheric pressure;

[0034] ③ Place the packaged organic optoelectronic device in figure 2 In the vacuum cavity 9 shown, and adjust the gas pressure in the vacuum cavity 9, so that the pressure difference between the water vapor encapsulated in the organic optoelectronic device and the pressure difference in the vacuum cavity is close to the actual use;

[0035] ④ Place the organic optoelectronic device in the vacuum chamber for 30 minutes to 10 hours;

[0036]⑤ The water vapor leaking from the inside of the organic optoelectronic device into the vacuum chamber is analyzed by a mass spe...

Embodiment 3

[0038] Method for Calibration of Carbon Dioxide Hermeticity of Rigid Organic Optoelectronic Devices

[0039] ① Place the organic optoelectronic device to be tested in figure 1 In the package cavity 1 shown;

[0040] ②According to the actual test requirements, by figure 1 The shown gas pipeline 5 feeds carbon dioxide into the packaging cavity 1, and the adjusted pressure of the carbon dioxide is an atmospheric pressure;

[0041] ③ Place the packaged organic optoelectronic device in figure 2 In the vacuum chamber 9 shown, and adjust the gas pressure in the vacuum chamber 9, so that the pressure difference between the pressure of carbon dioxide encapsulated in the organic optoelectronic device and the pressure in the vacuum chamber is close to the actual use;

[0042] ④ Place the organic optoelectronic device in the vacuum cavity for 30 minutes to 10 hours;

[0043] ⑤ Analyzing the carbon dioxide leaking from the inside of the organic optoelectronic device into the vacuum ch...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a calibration method of airtightness of rigid organic optoelectronic device, which includes the following steps: (1) arranging the organic optoelectronic device to be tested in an enclosed cavity; (2) regulating the pressure and components of the gas in the enclosed cavity according to the requirements for the calibration of the airtightness; (3) arranging the enclosed organic optoelectronic device in a vacuum cavity, filling the gas with the required components into the vacuum cavity, and regulating the gas pressure in the vacuum cavity, so that the pressure difference between the organic optoelectronic device and the vacuum cavity can simulate the working environment of the device; (4) arranging the organic optoelectronic device in the vacuum cavity for a certain period of time; (5) using a spectral analyzing instrument which is connected with the vacuum cavity to analyze the corresponding gas which leaks from the organic optoelectronic device into the vacuum cavity, so as to accurately calibrate the airtightness; (7) optimizing the structure of the device, the enclosing material and the enclosing technology according to the calibrated airtightness of different gases or components.

Description

technical field [0001] The invention relates to the technical field of organic optoelectronic devices in electronic components, and relates to a method for calibrating the airtightness of rigid organic optoelectronic devices. Background technique [0002] Organic optoelectronic devices, such as organic electroluminescent devices (OLEDs), photovoltaic cells and field effect transistors (OFETs), have now developed into multidisciplinary international frontier topics and the focus of high-tech competition. At present, one of the reasons hindering the mass production of organic optoelectronic devices is the high cost of improving their life and stability. The cost investment in this aspect is mainly used to prevent the devices from being affected by the intrusion of gases such as water vapor and oxygen. performance. The importance of device sealing (including packaging) and evaluation system is particularly prominent. However, no matter at home or abroad, the test methods and ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01M3/02
Inventor 于军胜张磊蒋亚东李军建蒋泉
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA