Rigid organic opto-electronic device air tightness calibration method
A technology of optoelectronic devices and calibration methods, which is applied in the direction of liquid tightness measurement using liquid/vacuum degree, can solve the problems of only measuring, not measuring other gases, slow measuring speed, etc., and achieve the effect of improving service life
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Embodiment 1
[0024] Oxygen tightness calibration method for rigid organic optoelectronic devices:
[0025] ① Place the organic optoelectronic device to be tested in figure 1 In the package cavity 1 shown;
[0026] ②According to the actual test requirements, by figure 1 The shown gas pipeline 3 feeds oxygen into the packaging cavity 1, and the adjusted pressure of the oxygen is an atmospheric pressure;
[0027] ③ Place the packaged organic optoelectronic device in figure 2 In the shown vacuum cavity 9, and adjust the gas pressure in the vacuum cavity 9, so that the pressure difference between the pressure of oxygen encapsulated in the organic optoelectronic device and the pressure difference in the vacuum cavity is close to the actual use;
[0028] ④ Place the organic optoelectronic device in the vacuum chamber for 30 minutes to 10 hours;
[0029] ⑤ Analyzing the oxygen leaking from the inside of the organic optoelectronic device into the vacuum chamber through a mass spectrometer conn...
Embodiment 2
[0031] Method for Water Vapor Hermeticity Calibration of Rigid Organic Optoelectronic Devices
[0032] ① Place the organic optoelectronic device to be tested in figure 1 In the package cavity 1 shown;
[0033] ②According to the actual test requirements, by Figure 1 The shown gas pipeline 4 feeds water vapor into the packaging cavity 1, and the pressure of the adjusted water vapor is an atmospheric pressure;
[0034] ③ Place the packaged organic optoelectronic device in figure 2 In the vacuum cavity 9 shown, and adjust the gas pressure in the vacuum cavity 9, so that the pressure difference between the water vapor encapsulated in the organic optoelectronic device and the pressure difference in the vacuum cavity is close to the actual use;
[0035] ④ Place the organic optoelectronic device in the vacuum chamber for 30 minutes to 10 hours;
[0036]⑤ The water vapor leaking from the inside of the organic optoelectronic device into the vacuum chamber is analyzed by a mass spe...
Embodiment 3
[0038] Method for Calibration of Carbon Dioxide Hermeticity of Rigid Organic Optoelectronic Devices
[0039] ① Place the organic optoelectronic device to be tested in figure 1 In the package cavity 1 shown;
[0040] ②According to the actual test requirements, by figure 1 The shown gas pipeline 5 feeds carbon dioxide into the packaging cavity 1, and the adjusted pressure of the carbon dioxide is an atmospheric pressure;
[0041] ③ Place the packaged organic optoelectronic device in figure 2 In the vacuum chamber 9 shown, and adjust the gas pressure in the vacuum chamber 9, so that the pressure difference between the pressure of carbon dioxide encapsulated in the organic optoelectronic device and the pressure in the vacuum chamber is close to the actual use;
[0042] ④ Place the organic optoelectronic device in the vacuum cavity for 30 minutes to 10 hours;
[0043] ⑤ Analyzing the carbon dioxide leaking from the inside of the organic optoelectronic device into the vacuum ch...
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