Modularization scanning tools and method for detection thereof

Abstract

The invention provides a modularization scanning tool, for assisting at least one measuring device to measure an object, which comprises at least one scanning test module comprising a plurality of scanning test channels and at least one measuring circuit for electrically connecting the output and input of an object; at least one storage unit for the temporary storage of the control information controlling the measuring parameters and conditions; at least one first detection unit for detecting the application stage of the scanning test modules and selecting a corresponding scanning test module and a suitable measuring circuit to test the object; and a data processing unit for accessing the control information in the storage unit to make the storage unit transmit control information to a corresponding scanning test module to generate a start signal transmitted to the storage unit via the first detection unit for following measurement.

Description

technical field [0001] The invention belongs to the technical field of measurement, and in particular relates to a modular scanning tool capable of expanding multiple test channels and a detection method thereof. Background technique [0002] With the continuous vigorous development of electronics-related industries in recent years, especially 3C consumer products have become the mainstream of popular consumption. However, these products require a large number of electronic components. In order to ensure product quality, it is necessary to use various measuring devices to detect electronic components. Whether it meets the specifications or standards, such as detecting basic components such as capacitors, inductors and resistors, or components composed of basic components, including various winding components, communication and power filters, etc., as well as switches and connectors , wires, metal materials, dielectric materials, magnetic materials and semiconductors, etc. I...

AI Technical Summary

Problems solved by technology

[0003] The existing scanning tool (Scanner) is only composed of a simple relay (Relay) circuit. The relay is used to withstand high voltage and current to prevent the measuring device from being damaged by the current when measuring the object to be tested, so most of them are permanently fixed on the In the tool casing, once the number of objects to be tested exceeds the fixed number of test channels on the tool, or once it is changed to measure other physical or electrical characteristics (such as high voltage / high current) but the tool has When the relay circuit is not applicable but cannot be changed, the existing scanning tools cannot add or change test channels, which limits the number and types of measurements, resulting in only a small number of DUTs that can be measured at the same time, or can only be matched with specific measurement devices or measurements For the electrical and physical properties of a specific DUT, if you need to measure other physical properties of the DUT (such as capacitance / resistance / capacitance), you need to purchase other supporting scanning tools to use it, which will invisibly lead to increased man-hours and hardware costs, etc. question

[0004] In addition, the existing scanning tool (Scanner) can only be electrically connected to a measuring device (such as only measuring voltage) to measure various physical characteristics in the process of continuous measurement (such as measuring voltage first and then measuring resistance). A physical characteristic cannot be electrically connected to other types of measuring devices at the same time to continuously measure other physical characteristics, and because most of them rely on manual methods to set the parameters to be measured and their conditions or ranges on the measuring device, it is easy to cause human misjudgment problem; and the existing measuring device cannot actively manage the data as the measurement result, and it is necessary to manually adjust the measuring device while confirming until the data that meets the requirements is found, so the measurement efficiency and accuracy are poor

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