Automatic test system of sound surface filtering device

An automatic test system and filter device technology, applied in the field of test systems, to achieve the effect of improving reliability, avoiding accidental errors, and convenient and quick detection

Inactive Publication Date: 2009-04-22
SHOULDER ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The applicant has carried out research and improvement on the above-mentioned problems of using network analyzers to perform parameter testing manually, and provides a multifunctional automatic testing system for surface acoustic filter devic

Method used

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  • Automatic test system of sound surface filtering device
  • Automatic test system of sound surface filtering device
  • Automatic test system of sound surface filtering device

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Embodiment Construction

[0019] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0020] figure 1 It is a block diagram of the present invention. Such as figure 1 As shown, the present invention includes:

[0021] Measuring fixture 1, used to clamp the device under test;

[0022] The network analyzer 2 connected to the measurement fixture 1 is composed of three major connections: a frequency sweep signal source, a detector and a receiver. Under the control of the microprocessor installed inside the detector, the reflection characteristics or transmission The characteristics are scanned, the test parameters are collected, and the result of the scan (the test parameters collected) is output through the GPIB interface of the network analyzer 2;

[0023] The present invention also includes:

[0024] GPIB-PCI conversion circuit 3 is connected with the GPIB interface of network analyzer 2, and the GPIB bus output is conver...

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Abstract

An automatic measuring system for a surface acoustic wave filter device is composed of a measurement fixture, a network analyzer, a GPIB-PCI switching circuit, a computer, a human-machine interface, and an I/O interface circuit which are connected. The filter device is inserted in the measurement fixture, and the network analyzer scans the filter device to acquire testing parameters; the acquired testing parameters are output by a GPIB interface of the network analyzer and read in the computer by the GPIB-PCI switching circuit; the testing of the filter device is finished by an algorithm which is built in the computer; and finally the testing result is output and stored, and the computer automatically finishes the output of a grading signal by the I/O interface circuit. The setting of the network analyzer can be changed by the human-machine interface, or the testing can be directly finished in the computer by selecting the testing parameters of the surface acoustic wave filter device. The automatic measuring system can simultaneously measure a plurality of parameters without personnel participation during the data testing for once, and has the functions of parameter setting, data analysis, data storage, diagram generation and printing. The grading output signal is provided to control a grading mechanism to grade products.

Description

technical field [0001] The invention relates to a testing system for automatic testing and performance analysis of parameters of a surface acoustic wave filter device. Background technique [0002] Surface acoustic wave filter devices are also known as surface acoustic filter devices. Because of their strong anti-interference ability, small size, and no noise, they have a large market demand, a wide variety of specifications, and many manufacturers. At present, the main test method of surface acoustic wave filter devices is to use the network analyzer connected to the measurement fixture to perform parameter testing manually. The network analyzer is composed of three major connections: the sweep signal source, the detector and the receiver. , under the control of the microprocessor installed in the detector, the reflection characteristics or transmission characteristics of the device to be tested are scanned, and the test parameters are collected. Large and uncertain factor...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 李克修黄辉陈海卫
Owner SHOULDER ELECTRONICS CO LTD
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