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Time switch template test method for TD-SCDMA terminal

A TD-SCDMA, time switch template technology, applied in energy-saving ICT, power management, sustainable buildings, etc., can solve problems such as difficulty in ensuring instrument reliability, unfavorable development and measurement of new TD-SCDMA terminals, and achieve long-term reliable maintenance. The effect of low requirements on repeatability and repeatability, and solving the requirements of high performance

Inactive Publication Date: 2011-06-29
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method requires that the signals sent by the TD-SCDMA terminal twice before and after are basically the same, which is not conducive to the development and measurement of new TD-SCDMA terminal products; in addition, it has high requirements for the RF front-end of the test equipment, because the maximum signal normally sent by the terminal is +24dBm. When the terminal normally sends the maximum signal may reach +30dBm, when the RF attenuator is set to 0, the RF front-end is under the impact of high power for a long time, it is difficult to guarantee the reliability of the instrument

Method used

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  • Time switch template test method for TD-SCDMA terminal
  • Time switch template test method for TD-SCDMA terminal
  • Time switch template test method for TD-SCDMA terminal

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0040] Embodiment 1: The sampling clock is 2.56MHz, and the steps are as follows:

[0041] (1) Set up the RMC reference measurement channel of 12.2kbps between the TD-SCDMA terminal test device and the TD-SCDMA terminal, then configure the TD-SCDMA terminal to enter the loopback test mode, and make the TD-SCDMA terminal transmit with a single code channel, Control the transmit power of the TD-SCDMA terminal to the maximum and complete the preparation for the test;

[0042] (2) Set the RF switch of the test equipment to the closed state;

[0043] (3) Control the TD-SCDMA terminal under test to send signals;

[0044] (4) Send a control signal to the A / D converter through the time delay device in the test equipment to ensure that the rising edge of the first sampling clock lags behind the RF switch control signal, and the A / D converter samples 2 point, and the sampling data is sent to the data processing device to calculate the signal power value of each sampling point accordin...

Embodiment 2

[0061] Embodiment 2: The sampling clock is 76.8MHz, and the steps are as follows:

[0062] (1) Set up the RMC reference measurement channel of 12.2kbps between the TD-SCDMA terminal test device and the TD-SCDMA terminal, then configure the TD-SCDMA terminal to enter the loopback test mode, and make the TD-SCDMA terminal transmit with a single code channel, Control the transmit power of the TD-SCDMA terminal to the maximum and complete the preparation for the test;

[0063] (2) Set the RF switch of the test equipment to the closed state;

[0064] (3) Control the TD-SCDMA terminal under test to send signals;

[0065] (4) Send a control signal to the A / D converter through the time delay device in the test equipment to ensure that the rising edge of the first sampling clock lags behind the RF switch control signal, and the A / D converter samples 60 times in one chip time points, and the sampling data is sent to the data processing device to calculate the signal power value of eac...

Embodiment 3

[0085] Embodiment 3 The sampling clock is 76.8MHz, and the steps are as follows:

[0086] (1) Set up the RMC reference measurement channel of 12.2kbps between the TD-SCDMA terminal test device and the TD-SCDMA terminal, then configure the TD-SCDMA terminal to enter the loopback test mode, and make the TD-SCDMA terminal transmit with a single code channel, Control the transmit power of the TD-SCDMA terminal to the maximum and complete the preparation for the test;

[0087] (2) Set the RF switch of the test equipment to the closed state;

[0088] (3) Control the TD-SCDMA terminal under test to send signals;

[0089] (4) Send a control signal to the A / D converter through the time delay device in the test equipment to ensure that the rising edge of the first sampling clock lags behind the RF switch control signal, and the A / D converter samples 60 times in one chip time points, and the sampling data is sent to the data processing device to calculate the signal power value of each...

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Abstract

The invention relates to the field of application of radiofrequency conformance test of TD-SCDMA terminals, and relates to a time switch template test method for a TD-SCDMA terminal that a TD-SCDMA terminal test device measures power and time conversion of radiofrequency signals sent by the TD-SCDMA terminal. The method realizes the function of measuring greater power change of the signals of theTD-SCDMA terminal by controlling the closing / shutdown state of a radiofrequency switch to change the power that the radiofrequency signals reach a radiofrequency front-end, and can finish the test ofa time switch template (PVT) of the TD-SCDMA terminal within a subframe of 5ms; and the method has low requirement on the repetitiveness of the signals transmitted by the terminal. The closing / shutdown state of the radiofrequency switch is associated with values of the received radiofrequency signals, thereby well protecting a radiofrequency module and well meeting the requirement of high performance of other test methods on a radiofrequency channel.

Description

technical field [0001] The invention relates to the application field of TD-SCDMA terminal radio frequency conformance testing, in particular to a TD-SCDMA terminal time switch template testing method for measuring the power and time transformation of radio frequency signals sent by the TD-SCDMA terminal by a TD-SCDMA terminal testing device. Background technique [0002] Radio frequency conformance test is one of the most critical conformance tests in the communication industry. The radio frequency conformance test of TD-SCDMA terminals is strictly regulated in the standard 3GPP 34.122. RF fault location and other aspects play a very important role. [0003] Since the standard 3GPP 34.122 stipulates that the time switch mask test has high requirements on the test equipment, and the test equipment is required to measure the dynamic range of the power to be greater than 112dB / 1.28MHz. This technical indicator is difficult to achieve for the test equipment by using the traditi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04W24/10H04W52/00H04B17/00H04B17/13H04B17/327
CPCY02B60/50
Inventor 凌云志陈向民陆海杨政袁作涛
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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