Method and device for preparing pinpoint of scanning tunnel microscope (STM)

A technology of scanning tunneling and microscopy, applied in scanning probe microscopy, scanning probe technology, measuring devices, etc., can solve the problem of expensive needle tip, and achieve the effect of simple device, easy implementation, and small radius of curvature

Inactive Publication Date: 2010-04-07
NANJING UNIV
View PDF0 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the high-quality needle tips that can be purchased in the market are very expensive, so

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for preparing pinpoint of scanning tunnel microscope (STM)
  • Method and device for preparing pinpoint of scanning tunnel microscope (STM)
  • Method and device for preparing pinpoint of scanning tunnel microscope (STM)

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] Such as figure 1 As shown, a copper electrode 1 as a cathode and a tungsten wire 2 as an anode are connected in NaOH solution 3 . After electrification, the electrochemical reaction at the anode is Wu=Wu 2+ +2e - or Wu=Wu 3+ +3e - , the electrochemical reaction at the cathode is 2H + +2e-=H 2 . In this way, the tungsten wire will be corroded in the solution. For some reason, the corrosion at the liquid surface of the solution will be very fast, so the tungsten wire at the liquid surface will become thinner and thinner and eventually break to form a needle tip. However, the circuit must be cut off at the moment when the tungsten wire is disconnected, otherwise the needle tip will become blunt due to continuous corrosion, so a voltage feedback circuit is needed to control the on-off of the circuit. The copper electrode of the cathode is ring-shaped, and the tungsten wire of the anode is placed at the center of the circle, which requires an instrument table to fix t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a method for preparing a pinpoint of a scanning tunnel microscope (STM). The invention adopts the method of electrochemical corrosion, wherein the NaOH solution is taken as etchant solution; the copper electrode is taken as the negative pole; the tungsten filament is taken as the positive pole; in the electrochemical corrosion process, the tungsten filament at the liquid surface of the etchant solution is thinner and thinner and finally cracks to form a pinpoint, and the power circuit of the electrochemical corrosion is cut off in the instant that the tungsten filament is disconnected; a tungsten filament positive pole is arranged to string into the circuit of electrochemical corrosion to prepare the negative pole copper electrode into a ring shape; and simultaneously, the positive electrode tungsten filament is placed in the center of the ring-shaped circle and placed in the corrosion solution evenly; and the condition of the electrochemical corrosion is that the pressure of the pinpoint is 7-8V.

Description

technical field [0001] The invention relates to a scanning tunneling microscope needle point preparation method and a semi-automatic preparation device. Background technique [0002] The scanning tunneling microscope characterizes the morphology of the sample by using the tunneling current on the probe and the sample surface as the feedback signal. According to the quantum effect, the tunneling current is exponentially related to the distance between the probe and the sample surface. Therefore, using the tunneling current as a feedback signal makes the scanning tunneling microscope have extremely high spatial resolution and can realize real-space atomic-level imaging of the sample. . At the same time, by changing the tunneling conditions, the electronic structure of the sample surface can be measured in micro-regions. In recent years, people have successfully realized the measurement of the magnetization direction of the sample by using the tunnel magnetoresistance effect,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01Q60/16B82B3/00C25F3/08
Inventor 孙亮丁海峰游彪曹晓晖艾金虎
Owner NANJING UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap