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Preparation method of conductive scanning metallographic sample

A bakelite powder and container technology, which is applied in the field of scanning metallographic sample preparation, can solve problems such as poor adhesion, achieve low cost, shorten mixing time, and solve the effect of uneven distribution of conductive fillers

Inactive Publication Date: 2010-06-02
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to solve the problems of non-conductivity, uniform distribution of conductive fillers, and poor adhesion between conductive fillers and base materials in conductive scanning metallographic samples, and then provide a preparation method of conductive scanning metallographic samples

Method used

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Examples

Experimental program
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Effect test

specific Embodiment approach 1

[0012] Specific embodiment one: the steps of the preparation method of the conductive scanning metallographic sample of the present embodiment are:

[0013] Step 1: the selection of raw materials: choose bakelite powder as the base material; carbon black is the conductive filler, and the volume ratio of the selected bakelite powder to carbon black is 5: (2-3);

[0014] Step 2: Preparation of powder: first, add bakelite powder and carbon black with a volume ratio of 5: (2-3) into the container, which is filled with alcohol with the same volume as the bakelite powder; then, put the container into Heat to 100°C in a water bath, mechanically stir the alcohol mixture for 30 minutes; then pour the mixed mixture out of the container, and dry it at a temperature range of 50-100°C to obtain a composite material; finally, crush the dried composite material Complete the preparation of powder for particles with a particle diameter of less than 3mm;

[0015] Step 3: Forming the metallogra...

specific Embodiment approach 2

[0016] Specific embodiment two: the difference between this embodiment and specific embodiment one is: the volume ratio of bakelite powder and carbon black selected in step one is 5:2. Other steps and parameters are the same as those in Embodiment 1.

specific Embodiment approach 3

[0017] Specific embodiment three: the difference between this embodiment and specific embodiment one is: the volume ratio of bakelite powder and carbon black selected in step one is 5:3. Other steps and parameters are the same as those in Embodiment 1.

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Abstract

The invention relates to a preparation method of a scanning metallographic sample, particularly to a preparation method of a conductive scanning metallographic sample. The invention solves the problems of no conductibility of the scanning metallographic sample, homogeneous distribution of a conductive filling material and poor adhesive property between the conductive filling material and a base material. The method comprises the following steps of: selecting ebonite dust as the base material; selecting carbon soot as the conductive filling material, and adding the ebonite dust and the carbon soot in the volume proportion of 5:(2-3) into a container containing alcohol; heating the container to the temperature of 100DEG C, and stirring for 30 minutes; pouring out the mixture out offrom the container, and drying at the temperature of 50-100DEG C; pulverizing a dried composite material; putting the prepared powder into a mould, heating to the temperature of 130-150DEG C, simultaneously applying pressure to the mould, and retaining heat and pressure for 8-10 minutes; and taking out a sample to finish the preparation of the metallographic sample. The invention improves the adhesive property between the conductive filling material and the base material, and the conductive filling material is homogeneously distributed; the metallographic sample has stable physical-mechanical performance.

Description

technical field [0001] The invention relates to a method for preparing a scanning metallographic sample, belonging to the technical field of metallographic sample preparation. Background technique [0002] When doing material scanning electron microscope metallographic observation, it is required that the metallographic sample and the sample platform must be electrically connected, and some scanning electron microscope metallographic observation samples need to be processed into a certain shape and size due to various reasons. The traditional method is to test Put the metallographic sample into a mold of a certain shape, add organic polymer fillers such as bakelite powder or electric jade powder, and then apply pressure and raise the temperature to 120-130°C to solidify to prepare the sample. The sample prepared by this method has certain strength and hardness, high sample preparation efficiency, low price, and is convenient for polishing and grinding. However, since the fi...

Claims

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Application Information

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IPC IPC(8): G01N1/28G01N1/44
Inventor 王洪林高晶杨静李娟耿林
Owner HARBIN INST OF TECH
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