Preparation method of conductive scanning metallographic sample
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- HARBIN INST OF TECH
- Publication Date
- 2010-06-02
- Estimated Expiration
- Not applicable · inactive patent
Abstract
Description
technical field
[0001] The invention relates to a method for preparing a scanning metallographic sample, belonging to the technical field of metallographic sample preparation. Background technique
[0002] When doing material scanning electron microscope metallographic observation, it is required that the metallographic sample and the sample platform must be electrically connected, and some scanning electron microscope metallographic observation samples need to be processed into a certain shape and size due to various reasons. The traditional method is to test Put the metallographic sample into a mold of a certain shape, add organic polymer fillers such as bakelite powder or electric jade powder, and then apply pressure and raise the temperature to 120-130°C to solidify to prepare the sample. The sample prepared by this method has certain strength and hardness, high sample preparation efficiency, low price, and is convenient for polishing and grinding. However, since the fi...