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Method for correcting plasma emission spectral line self-absorption effect

A self-absorption effect, plasma technology, applied in thermal excitation analysis, material excitation analysis, etc., can solve problems such as unsatisfactory results, complex measurement and calculation, etc., and achieve fast calculation speed, easy implementation, and improved accuracy

Active Publication Date: 2012-05-23
SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] In order to solve the deficiencies in the prior art that the measurement and calculation are very complicated and the effect is not ideal, the purpose of the present invention is to propose a method for correcting the self-absorption effect of the plasma emission line based on the internal reference line

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  • Method for correcting plasma emission spectral line self-absorption effect
  • Method for correcting plasma emission spectral line self-absorption effect
  • Method for correcting plasma emission spectral line self-absorption effect

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Embodiment Construction

[0025] Such as figure 1 As shown, the working process of the method for correcting the self-absorption effect of the plasma emission line based on the internal reference line of the present invention is:

[0026] Based on the internal reference line, the corrected plasma emission line intensity is obtained by calculating the self-absorption correction coefficient of the line, and the specific steps are as follows:

[0027] Step 1) Select a spectral line whose self-absorption effect can be ignored in the plasma emission spectral line of the analyzed element as an internal reference line, and consider that its self-absorption correction coefficient value is 1;

[0028] Step 2) calculate the plasma temperature T of all analyzed elements;

[0029] Step 3) Calculate the self-absorption correction coefficient of the spectral line of the analysis line through the calculation formula of the self-absorption correction coefficient;

[0030] The formula for calculating the spectral lin...

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Abstract

The invention discloses a method for correcting plasma emission spectral line self-absorption effect. Based on an internal reference line, the intensity of the plasma emission spectral line after correction is obtained through calculating spectral line self-absorption correction coefficient. The specific steps are: 1) one plasma emission spectral line with self-absorption correction coefficient of one in the plasma emission spectral lines of elements to be analyzed is selected as the internal reference line; 2) the plasma temperature T of the elements to be analyzed is calculated; 3) the spectral line self-absorption correction coefficient of an analytical line is calculated through a self-absorption correction coefficient calculation formula; 4) the intensity of the spectral line of the analytical line is corrected according to the self-absorption correction coefficient of the analytical line; and 5) the steps are repeated, the intensity of the spectral line is cyclically corrected, the corrected intensity of the plasma emission spectral line is finally obtained when the self-absorption correction coefficient of the analytical line reaches the preset accuracy, and the correction of the self-absorption effect is completed. By adopting the method, the invention has the advantages that the plasma temperature is calculated more accurately and the quantitative analysis of the material compositions is conducted more accurately.

Description

technical field [0001] The invention relates to the fields of plasma temperature calculation and sample composition analysis, and specifically relates to a method for correcting the self-absorption effect of plasma emission spectrum lines based on an internal reference line. Background technique [0002] Plasma emission spectroscopy is often used for quantitative analysis of material composition, such as laser-induced breakdown spectroscopy (LIBS) and inductively coupled plasma emission spectroscopy (ICP-AES) analysis techniques. This type of technology uses the relationship between the intensity of the atomic or ion spectral line in the plasma emission line and the element concentration to quantitatively analyze the element content in the analyte. If the plasma is an optically thin plasma, that is, there is no self-absorption effect in the emission line, then there is usually a linear relationship between the intensity of the line and the concentration of the element. Using...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/73
Inventor 于海斌孙兰香杨志家郭前进辛勇丛智博
Owner SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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