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APD (Angular position digitizer) voltage and temperature curve testing device and use method thereof

A technology of temperature curve and testing device, which is applied in the field of APD voltage temperature curve testing device, can solve the problems of large difference between breakdown voltage and voltage temperature curve, lack of automatic and accurate measurement, and large temperature coefficient difference, etc., to achieve low cost, The circuit is simple and the effect of improving the measurement accuracy

Inactive Publication Date: 2010-07-28
WEIHAI BEIYANG ELECTRIC GRP CO LTD BEIJING BRANCH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the large discreteness of APD devices, their breakdown voltage and voltage-temperature curves are quite different. Manufacturers generally provide the breakdown voltage at each APD reference temperature (usually at 25°C) and the operating voltage for a specific gain. , but the temperature coefficient will only provide a typical value, which is not suitable for every APD, and the temperature coefficient varies greatly at different temperatures, so it is very important to accurately measure the curve of APD voltage versus temperature when the gain is the same, but there is a lack of in the prior art Effective means of automatic and accurate measurement

Method used

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  • APD (Angular position digitizer) voltage and temperature curve testing device and use method thereof
  • APD (Angular position digitizer) voltage and temperature curve testing device and use method thereof
  • APD (Angular position digitizer) voltage and temperature curve testing device and use method thereof

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Embodiment Construction

[0032] The application of the APD voltage temperature curve test device of the present invention in the field of optical fiber sensing is taken as an example below to describe the present invention in detail.

[0033] Such as figure 1 As shown, the test device includes the following parts:

[0034] MCU (Single Chip Microcomputer) 1: 1pc2136 of NXP Company is selected;

[0035] DAC (analog-to-digital converter) 2: Choose the 14-bit AD5531 from AD;

[0036] ADC (digital-to-analog converter) 3: Use AD7940 with 14-bit precision 7M sampling rate from AD;

[0037] APD power supply 4: Use domestically made 300V high voltage power supply;

[0038] Current to voltage converter 5: The main chip is OPA657 from TI (Texas Instruments);

[0039] Temperature sensor 6: Use DS18B20 with 12-digit precision digital temperature sensor from DALLAS;

[0040] APD (Avalanche Photodiode) 7: Use SAR500APD of LMADA PACIFIC INC;

[0041] Adjustable thermostat 8: It is a self-made adjustable thermostat with a temperatu...

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Abstract

The invention discloses an APD voltage and temperature curve testing device and a use method thereof. The device mainly comprises a computer, an MCU (Microcontroller Unit), a DAC (Digital-to-Analog Converter), an ADC (Analog-to-Digital Converter), an APD power supply, a current and voltage converter, a temperature sensor, an angular position digitizer, an adjustable thermostat and a light source. The invention realizes automatic accurate test on the basis of the MCU and meanwhile has the advantages of simple circuit, low cost, safety, reliability and the like, thereby being suitable for testing APD voltage and temperature curves in multiple fields of communication, optical fiber sensing and the like.

Description

Technical field [0001] The invention relates to an APD (Avalanche Photodiode) voltage temperature curve test device and a use method thereof, in particular to an automatic test device based on a single-chip microcomputer that can accurately test the APD voltage temperature curve. Background technique [0002] APD is a sensor made of the photoconductivity effect of semiconductor materials. APD has the characteristics of high gain, high sensitivity, etc., and has a wide range of applications in various fields of military and national economy. For example, in the fields of optical communications, industrial automatic control, photometric measurement, and fiber optic sensing. [0003] APD is very sensitive to temperature. Various electrical parameters of APD change with the change of ambient temperature. Among them, the parameters that change the most are breakdown voltage and gain. When the temperature increases, the breakdown voltage of the APD increases, and when the temperature d...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R19/25G01K7/00
Inventor 史振国张斌高明
Owner WEIHAI BEIYANG ELECTRIC GRP CO LTD BEIJING BRANCH
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