APD (Angular position digitizer) voltage and temperature curve testing device and use method thereof
A technology of temperature curve and testing device, which is applied in the field of APD voltage temperature curve testing device, can solve the problems of large difference between breakdown voltage and voltage temperature curve, lack of automatic and accurate measurement, and large temperature coefficient difference, etc., to achieve low cost, The circuit is simple and the effect of improving the measurement accuracy
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Publication Date
- 2010-07-28
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
Technical field
[0001] The invention relates to an APD (Avalanche Photodiode) voltage temperature curve test device and a use method thereof, in particular to an automatic test device based on a single-chip microcomputer that can accurately test the APD voltage temperature curve. Background technique
[0002] APD is a sensor made of the photoconductivity effect of semiconductor materials. APD has the characteristics of high gain, high sensitivity, etc., and has a wide range of applications in various fields of military and national economy. For example, in the fields of optical communications, industrial automatic control, photometric measurement, and fiber optic sensing.
[0003] APD is very sensitive to temperature. Various electrical parameters of APD change with the change of ambient temperature. Among them, the parameters that change the most are breakdown voltage and gain. When the temperature increases, the breakdown voltage of the APD increases, and when the temperature d...
Examples
Embodiment Construction
[0032] The application of the APD voltage temperature curve test device of the present invention in the field of optical fiber sensing is taken as an example below to describe the present invention in detail.
[0033] Such as figure 1 As shown, the test device includes the following parts:
[0034] MCU (Single Chip Microcomputer) 1: 1pc2136 of NXP Company is selected;
[0035] DAC (analog-to-digital converter) 2: Choose the 14-bit AD5531 from AD;
[0036] ADC (digital-to-analog converter) 3: Use AD7940 with 14-bit precision 7M sampling rate from AD;
[0037] APD power supply 4: Use domestically made 300V high voltage power supply;
[0038] Current to voltage converter 5: The main chip is OPA657 from TI (Texas Instruments);
[0039] Temperature sensor 6: Use DS18B20 with 12-digit precision digital temperature sensor from DALLAS;
[0040] APD (Avalanche Photodiode) 7: Use SAR500APD of LMADA PACIFIC INC;
[0041] Adjustable thermostat 8: It is a self-made adjustable thermostat with a temperatu...