Solid-state imaging device, manufacturing method of the same, and electronic apparatus

A technology of a solid-state imaging device and a manufacturing method, which is applied in radiation control devices, televisions, circuits, etc., can solve problems such as difficulty in reading signal charges, and achieve the effect of improving reading characteristics

Inactive Publication Date: 2010-10-06
SONY CORP
View PDF11 Cites 23 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

That is, when the hole charge storage region 107 approaches the transfer gate electrode 111, the gate voltage (read voltage) Vtg of the transfer transistor Tr1 increases, and thus it becomes difficult to read the signal charge

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Solid-state imaging device, manufacturing method of the same, and electronic apparatus
  • Solid-state imaging device, manufacturing method of the same, and electronic apparatus
  • Solid-state imaging device, manufacturing method of the same, and electronic apparatus

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0046] 2. First Embodiment (Exemplary Configuration of Solid-State Imaging Device and Exemplary Manufacturing Method Thereof)

no. 2 example

[0047] 3. Second Embodiment (Exemplary Configuration of Solid-State Imaging Device)

no. 3 example

[0048] 4. Third Embodiment (Exemplary Configuration of Solid-State Imaging Device)

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A solid-state imaging device includes plural photodiodes which are formed in a photodiode area of a unit pixel with no element separating area interposed therebetween and in which impurity concentrations of pn junction areas are different from each other.

Description

technical field [0001] The present invention relates to a solid-state imaging device, a method of manufacturing the same, and electronic equipment (such as a camera including the solid-state imaging device). Background technique [0002] As a solid-state imaging device, an amplifying type solid-state imaging device is known, a representative example of which is a MOS image sensor such as a CMOS (Complementary Metal Oxide Semiconductor) image sensor. In addition, there is also known a charge transport type solid-state imaging device, a representative example of which is a CCD (Charge Coupled Device) image sensor. These solid-state imaging devices are widely used in digital still cameras, digital video cameras, and the like. In recent years, for solid-state imaging devices mounted on cellular phones with cameras or PDAs (Personal Digital Assistants), MOS image sensors are widely used due to low voltage, low power consumption, and the like. [0003] In a MOS type solid-state ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/146H01L31/08H01L31/0256H01L31/18H04N5/335H01L31/10
CPCH01L27/14627H01L27/14621H01L27/14643H01L27/14689H01L27/14609H01L31/103H01L27/14612H01L27/14605
Inventor 糸长总一郎
Owner SONY CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products