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Method for testing resonant power amplifying circuit

A technology of power amplifier circuit and testing method, which is applied in the direction of electronic circuit testing, etc., can solve problems such as loss, irreversible breakdown damage of semiconductor power amplifier components, and achieve the effects of avoiding breakdown damage, shortening production cycle, and reducing production cost

Active Publication Date: 2010-11-24
ZHUHAI HOKAI MEDICAL INSTR +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Resonant power amplifying circuits are widely used in many fields, but the disadvantages of the prior art are: before the resonant power amplifying circuit is put into use, there is no special test method and tooling for the resonant power amplifying circuit, and in the case of high supply voltage When used directly, if there is a problem with the quality of the device or the circuit connection, it is very easy to cause irreversible breakdown damage to the semiconductor power amplifier device, resulting in a large loss

Method used

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  • Method for testing resonant power amplifying circuit
  • Method for testing resonant power amplifying circuit
  • Method for testing resonant power amplifying circuit

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Embodiment Construction

[0012] figure 1 Shown is a typical resonant power amplifier circuit, which includes a three-phase AC input terminal, a three-phase rectified full-bridge, a filter module, a full-bridge series resonant power amplifier module, a transformer component, a self-excited voltage-controlled oscillator and a pre-amplifier amplifier. Among them, the full bridge series resonant power amplification module is composed of a full bridge built by MOS transistors Q1-Q4, a series resonant inductor L1, and a coupling resonant capacitor C1. The input terminal of the self-excited voltage-controlled oscillator is connected to the resonant current sampling point of the full-bridge series resonant power amplifier module to form a positive feedback loop. The oscillation frequency of the voltage-controlled oscillator is controlled by the rectified and filtered DC voltage output from the secondary output of the power amplifier load transformer. The higher the output voltage, the lower the oscillation f...

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Abstract

The invention discloses a method for testing a resonant power amplifying circuit which comprises a full-bridge series resonant power amplifier module, a transformer component, a self-excited voltage-controlled oscillator and a preamplifier. The method comprises the following steps: 1, providing a direct current (DC) voltage source, a signal source and an oscilloscope which are used for test; 2, judging whether the primary voltage-frequency property of the transformer component is normal or not; 3, judging whether the variation relationship between the working frequency and the power supply voltage of the resonant power amplifying circuit is normal; 4, testing whether the DC voltage waveform of the secondary output of the transformer component after rectification and filtration is normal or not; 5, testing the stability of the DC voltage waveform of the secondary output of the transformer component after rectification and filtration; and 6, if step 2 to step 5 are all qualified, judging that the resonant power amplifying circuit is tested to be qualified. The test method of the invention can effectively avoid breakdown damage on semiconductor power amplifying parts caused by part quality or circuit connection in production process.

Description

technical field [0001] The invention relates to the technical field of electronic circuits, in particular to a test method for a resonant power amplifier circuit. Background technique [0002] Power amplifying circuits with reactive loads are collectively referred to as resonant power amplifying circuits, which can be divided into series, parallel and series-parallel resonant power amplifier circuits according to the connection mode between resonant devices and loads. [0003] Resonant power amplifying circuits are widely used in many fields, but the disadvantages of the prior art are: before the resonant power amplifying circuit is put into use, there is no special test method and tooling for the resonant power amplifying circuit, and in the case of high supply voltage When used directly, if there is a problem with the quality of the device or the circuit connection, it is very easy to cause irreversible breakdown damage to the semiconductor power amplifier device, resultin...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 林丹陈天申
Owner ZHUHAI HOKAI MEDICAL INSTR
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