Sine stripe projection device and three-dimensional profile measuring method

A projection device and sinusoidal stripe technology are applied in the field of three-dimensional profile measurement based on multi-wavelength sinusoidal stripe structured light projection, which can solve the problems of high price of three-dimensional profile measurement equipment and poor optical quality, and achieve low cost, high running speed, The effect of high measurement accuracy

Inactive Publication Date: 2011-01-05
SHANGHAI FUDAE INTELLIGENT SCI & TECH
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Problems solved by technology

[0003] The technical problem to be solved by the present invention is to overcome the defects of high price and poor optical quality of the three-dimensional profile measurement equipment in the prior art, and provide a high-speed, high-

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  • Sine stripe projection device and three-dimensional profile measuring method
  • Sine stripe projection device and three-dimensional profile measuring method
  • Sine stripe projection device and three-dimensional profile measuring method

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Embodiment Construction

[0023] The preferred embodiments of the present invention are given below in conjunction with the accompanying drawings to describe the technical solution of the present invention in detail.

[0024] In order to measure the three-dimensional profile of the measured object, especially to realize high-speed and high-precision solder paste measurement in the electronic manufacturing SMT process, so as to effectively improve the quality of electronic assemblies, the present invention adopts multi-wavelength sinusoidal fringe structured light irradiation The surface of the measured object, because the three-dimensional surface shape of the measured object will produce spatial modulation on the structured light illumination beam, which leads to the deformation of the structured light. When these deformations are observed from another perspective through a camera, it can be based on the deformation data Realize the three-dimensional reconstruction of the surface shape of the measured ...

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Abstract

The invention discloses a sine stripe projection device and a three-dimensional profile measuring method realized by using the sine stripe projection device. The method comprises the following steps of: (S1) correcting the intensity of each wavelength light emitted from the sine stripe projection device; (S2) acquiring the actual phase shift between every two wavelength stripes; (S3) marking the camera, and carrying out phase-height marking on the projection of each wavelength stripe in sequence; (S4) projecting each wavelength stripe to a measured object in sequence through the projection device, shooting each wavelength stripe projection image of the surface of the measured object through the camera, calculating out the initial phase of each measuring point through each wavelength stripe projection image, and unwrapping the initial phases; and (S5) respectively acquiring the height coordinate of each measuring point through the unwrapped initial phase of the measuring point according to the phase-height marking, and acquiring the three-dimensional coordinate of the measuring point through the camera marking. The measuring scheme has the advantages of high operating speed, high measuring precision and low cost.

Description

technical field [0001] The invention relates to a sinusoidal fringe projection device and a three-dimensional profile measurement method realized by the sinusoidal fringe projection device, in particular to a three-dimensional profile measurement method based on multi-wavelength sinusoidal fringe structured light projection. Background technique [0002] In precise three-dimensional profile measurement, high-precision motors or precision projectors are commonly used in the industry to realize the phase shift between fringe projections of different wavelengths. However, the above-mentioned equipment inevitably has various defects, such as: high-precision motors are expensive, assembly requirements are high, and it is difficult to achieve mass production of equipment; and precision projectors are not only expensive, but also have low light transmittance and are difficult to focus . The above problems have seriously affected the wide application of precise three-dimensional pr...

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Application Information

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IPC IPC(8): G01B11/25
Inventor 徐亦新李强盛鹏张栋黄豪
Owner SHANGHAI FUDAE INTELLIGENT SCI & TECH
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