All-in-one machine of semiconductor device for testing, sorting, marking and braiding and one-stop processing method
A processing method and semiconductor technology, applied in the direction of semiconductor/solid-state device testing/measurement, semiconductor/solid-state device manufacturing, electrical components, etc., can solve problems such as waste of labor, complicated operation, and failure to meet market demand, so as to improve work efficiency, The effect of guaranteeing the pass rate
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[0038] Such as figure 1 , figure 2 , image 3 , Figure 4 As shown, figure 1 It is the working position and station distribution diagram of the main turret system and the laser marking turret system of the present invention, figure 2 Is a schematic diagram of the three-dimensional structure of the present invention, image 3 Is a schematic side view of the structure of the present invention, Figure 4 It is a schematic diagram of the station distribution of the device processing system of the present invention. Now combined figure 1 , figure 2 , image 3 , Figure 4 The embodiment of the present invention is described in detail: an integrated machine for testing, sorting, marking and taping of semiconductor devices, including a machine body 1 and various device processing systems that are fixedly connected to the machine body, and a 16 working machine is provided on the machine body 1. The main turret system 2 and a 16-station laser marking turret system 3 matched with it, ...
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