Method for modeling P-channel metal oxide semiconductor (PMOS) one-time programmable memory (OTP) device
A modeling method and device technology, which can be used in instruments, special data processing applications, electrical digital data processing, etc., and can solve problems such as small area and short writing time.
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[0016] like image 3 Shown is the flowchart of the modeling method of PMOS OTP device of the present invention, and the present invention comprises the steps:
[0017] Step 1. Establish a set of equivalent circuits according to the structure and working principle of the PMOS OTP device. like Figure 4 As shown, the equivalent circuit structure includes: a PMOS selection transistor, a PMOS floating gate transistor, the PMOS selection transistor and the PMOS floating gate transistor form a series structure in which the drain end of the PMOS selection transistor is connected to the source end of the PMOS floating gate transistor The body potential of the PMOS selection transistor and the PMOS floating gate transistor is connected in series, the source terminal of the PMOS selection transistor is connected to the source voltage, and the gate is connected to the gate voltage; the drain terminal of the PMOS floating gate transistor is connected to the drain voltage, and the drain t...
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