Device and method for testing rectifier
A test device and test method technology, which is applied in the field of rectifier test devices, can solve problems such as power system tripping, energy waste, and increased test costs, and achieve the effects of reducing power requirements, reducing energy consumption, and saving test costs
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Embodiment 1
[0036] figure 1 The schematic structural diagram of the rectifier test device provided by Embodiment 1 of the present invention, such as figure 1 As shown, the rectifier test device includes a transformer 101 and a load module, the output terminal of the transformer 101 is connected to the AC voltage input terminal of the rectifier 102 to be tested, the load module is an inverter 103, and the DC voltage input terminal of the inverter 103 is connected to the input terminal of the rectifier 102 to be tested. The DC voltage output terminal of the rectifier 102 to be tested is connected, and the AC voltage output terminal of the inverter 103 and the output terminal of the transformer 101 are connected in parallel to the AC voltage input terminal of the rectifier 102 to be tested.
[0037] In the specific test process, the rectifier 102 to be tested converts the AC voltage output by the transformer 101 into a DC voltage and outputs it to the inverter 103, and the inverter 103 conve...
Embodiment 2
[0039] In this embodiment, the rectifier test device uses another rectifier whose control switch is a fully-controlled transistor as an inverter, which is used as a load, and the DC voltage output terminal of the rectifier used as a load is the DC voltage input terminal of the inverter. The AC voltage input of the rectifier used as load is the AC voltage output of the inverter. If the control switch in the rectifier to be tested is a full-control transistor, another rectifier to be tested can be used as an inverter as the load of the rectifier to be tested to test its performance, which is convenient to obtain materials and can also reduce the cost of test equipment.
[0040] figure 2 It is a schematic circuit diagram of a rectification test device provided in Embodiment 2 of the present invention. The rectifier to be tested in the rectification test device is a single-phase high-power four-quadrant rectifier, but the present invention is not limited thereto. Such as figur...
Embodiment 3
[0046] image 3 The circuit schematic diagram of another rectifier test device provided by Embodiment 3 of the present invention, the rectifier to be tested in the rectifier test device is a three-phase high-power four-quadrant rectifier, but the present invention is not limited thereto. Such as image 3 As shown, the transformer 101 in the rectifier test device is a three-phase transformer, and the connection relationship between the three-phase transformer, the three-phase rectifier to be tested and the three-phase inverter is the same as figure 2 The illustrated embodiments are similar, and will not be repeated here.
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