Preparation method of nanowire array with Si/NiSi nuclear shell structure
A nanowire array and silicon nanowire array technology are applied in the field of preparation of Si/NiSi core-shell structure nanowire arrays, which can solve the problems of limiting the processing technology of Si nanowire devices, and achieve the effect of huge application value.
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Embodiment 1
[0018] 1) Soak the monocrystalline silicon substrate cleaned with hydrofluoric acid in a mixed aqueous solution of silver nitrate and hydrofluoric acid for 3 minutes; wherein, the concentration of silver nitrate in the mixed aqueous solution of silver nitrate and hydrofluoric acid is 5 mmol / L, the concentration of hydrofluoric acid is 4.8mol / L; the monocrystalline silicon substrate immersed in the mixed aqueous solution of silver nitrate and hydrofluoric acid is etched in the etching aqueous solution mixed with hydrogen peroxide and hydrofluoric acid, wherein, The concentration of hydrogen peroxide in the etching solution mixed with hydrogen peroxide and hydrofluoric acid is 4mmol / L, and the concentration of hydrofluoric acid is 4.8mol / L; etching is performed in a water bath, the temperature of the water bath is 50°C, and the etching time is 15 minutes , where silver ions are deposited on the surface of the single crystal silicon substrate, Si will be etched down, and where no...
Embodiment 2
[0022] 1) Soak the monocrystalline silicon substrate cleaned with hydrofluoric acid in a mixed aqueous solution of silver nitrate and hydrofluoric acid for 3 minutes; wherein, the concentration of silver nitrate in the mixed aqueous solution of silver nitrate and hydrofluoric acid is 5 mmol / L, the concentration of hydrofluoric acid is 4.8mol / L; the monocrystalline silicon substrate immersed in the mixed aqueous solution of silver nitrate and hydrofluoric acid is etched in the etching aqueous solution mixed with hydrogen peroxide and hydrofluoric acid, wherein, The concentration of hydrogen peroxide in the etching solution mixed with hydrogen peroxide and hydrofluoric acid is 4mmol / L, and the concentration of hydrofluoric acid is 4.8mol / L; etching is performed in a water bath, the temperature of the water bath is 50°C, and the etching time is 30 minutes , where silver ions are deposited on the surface of the single crystal silicon substrate, Si will be etched down, and where no...
Embodiment 3
[0026] 1) Soak the monocrystalline silicon substrate cleaned with hydrofluoric acid in a mixed aqueous solution of silver nitrate and hydrofluoric acid for 3 minutes; wherein, the concentration of silver nitrate in the mixed aqueous solution of silver nitrate and hydrofluoric acid is 5 mmol / L, the concentration of hydrofluoric acid is 4.8mol / L; the monocrystalline silicon substrate immersed in the mixed aqueous solution of silver nitrate and hydrofluoric acid is etched in the etching aqueous solution mixed with hydrogen peroxide and hydrofluoric acid, wherein, The concentration of hydrogen peroxide in the etching solution mixed with hydrogen peroxide and hydrofluoric acid is 4mmol / L, and the concentration of hydrofluoric acid is 4.8mol / L; etching is performed in a water bath, the temperature of the water bath is 50°C, and the etching time is 30 minutes , where silver ions are deposited on the surface of the single crystal silicon substrate, Si will be etched down, and where no...
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