Double-pulse test method for IGBT module
A test method, double-pulse technology, applied in the field of double-pulse test, can solve the problems of lack of guidance and reference for commercial application, failure to obtain dynamic characteristic parameters, lack of better test methods, etc., to achieve simple test circuit, low test risk, Reliable effect of the test method
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[0051] Method of the present invention specifically comprises the following steps:
[0052] 1) Carry out test circuit wiring according to the test circuit diagram;
[0053] 2) After checking that the wiring is correct, the main circuit is switched on and powered on;
[0054] 3) The T1 and T4 tubes are always in the blocked state, and the T2 tube is in the open state, blocking the PWM pulse of the tested IGBT (T3 tube);
[0055] 4) Assuming that the capacitor is large, charge the DC capacitor to the rated value U N , the capacitor voltage remains basically unchanged after charging is completed;
[0056] 5) Disconnect the rectifier charging circuit;
[0057] 6) Send a PWM pulse to the tested IGBT module (T3 tube), and T3 is turned on, so the DC capacitor C, the reactor L and the upper right IGBT T2 form a loop, and the current on the reactor increases linearly until it reaches the peak value of the rated current of the device I M , observe its conduction waveform through an...
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Application Information
- IPC
- G01R31/26; G01R31/327
- Inventors
- 王轩; 王柯