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Industrial device rapid locating method based on machine vision

A technology of machine vision and positioning method, which is applied in the direction of instruments, image data processing, optical testing flaws/defects, etc., and can solve the problem of high price

Inactive Publication Date: 2012-09-26
辽宁科锐科技有限公司 +1
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Problems solved by technology

However, most of the core methods currently used are foreign technologies, and their high prices often discourage us.

Method used

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  • Industrial device rapid locating method based on machine vision
  • Industrial device rapid locating method based on machine vision
  • Industrial device rapid locating method based on machine vision

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Embodiment Construction

[0031] A rapid positioning method for industrial devices based on machine vision is a device positioning method adopted by machine vision software running on a hardware environment built by industrial lenses, industrial cameras, image acquisition cards and industrial personal computers.

[0032] Its hardware and software environment are as follows:

[0033] Its hardware part includes industrial light source, industrial lens, industrial camera, image acquisition card and industrial computer. Among them: the light source provides stable and uniform lighting conditions for the camera, which can effectively improve the image quality; the industrial lens is the basis of precise positioning, and is an optical device that can provide clear images; the industrial camera is an image sensing component, which is a high-resolution image sensor, using this camera can obtain high-resolution images; the image acquisition card is installed in the industrial computer and is the core part of fa...

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Abstract

The invention relates to an industrial device rapid locating method based on machine vision, which is a device locating method adopted by machine vision software running in a hardware environment built by an industrial lens, an industrial camera, an image gathering card and an industrial personal computer. The method provided by the invention is a method with combined multiresolution analysis andwavelet transformation characteristics, and the method comprises the following steps of: firstly locating approximately according to the projection transformation vectors of horizontal and vertical direction coefficients of wavelet transformation, then implementing template matching in a low-resolution image, and finally accurately locating in the approximately located field of the original image. The application effect of the method in semiconductor and electronic manufacturing industry is excellent, the locating speed is particularly and obviously improved by means of multiresolution analysis and location preparation, and the locating process of a wafer can be completed in about 10 milliseconds.

Description

technical field [0001] The invention relates to an industrial device positioning method, in particular to a machine vision-based rapid positioning method for industrial devices. Background technique [0002] In recent years, with the continuous improvement of my country's industrial automation level, more and more enterprises and institutions adopt active machine vision positioning systems, and use cameras, image acquisition cards and industrial computers to accurately position parts. For example, the application of visual sensing technology and machine vision in the semiconductor industry started as early as 20 years ago. The semiconductor and electronic equipment market is the birthplace of machine vision technology and has always been one of the huge markets on which machine vision depends. Every technological leap in the semiconductor and electronics manufacturing industries, such as: wafers are getting bigger and bigger, and internal circuits are getting thinner and thi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G01N21/88
Inventor 付先平廖圣龙袁国良蔡晓洁
Owner 辽宁科锐科技有限公司
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