Method for testing fault of multiposition memorizer inlaid in FPGA
A test method and memory technology, applied in static memory, instruments, etc., can solve the problem of not being able to detect coupling faults of storage units, and achieve the effect of easy implementation and improved fault coverage
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0065] Taking Xilinx's Spartan-3 series XC3S400 FPGA embedded memory as the test object, a test method for the fault of the embedded multi-bit memory in FPGA is described. The specific implementation steps of the method are as follows:
[0066] Step 1: First, add test patterns based on the March C-algorithm. For the embedded n-bit memory inside the FPGA, the number of test patterns should be 2×(1+log 2 n). XC3S400 FPGA embedded memory bit width is 16 bits, so the number of test patterns is 10. The test pattern looks like this:
[0067] Group0
0000000000000000
Group1
1111111111111111
Group2
0101010101010101
Group3
1010101010101010
Group4
0011001100110011
Group5
1100110011001100
Group6
0000111100001111
Group7
1111000011110000
Group8
0000000011111111
Group9
1111111100000000
[0068] Step 2: Substituting 10 test patterns into the 6 March elements of the March C-alg...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com