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Method for testing fault of multiposition memorizer inlaid in FPGA

A test method and memory technology, applied in static memory, instruments, etc., can solve the problem of not being able to detect coupling faults of storage units, and achieve the effect of easy implementation and improved fault coverage

Inactive Publication Date: 2011-08-17
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0021] If the above-mentioned March C-algorithm is directly extended into a cell-oriented memory test algorithm, coupling faults between storage cells can be detected, but coupling faults within storage cells cannot be detected

Method used

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  • Method for testing fault of multiposition memorizer inlaid in FPGA
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  • Method for testing fault of multiposition memorizer inlaid in FPGA

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Embodiment Construction

[0065] Taking Xilinx's Spartan-3 series XC3S400 FPGA embedded memory as the test object, a test method for the fault of the embedded multi-bit memory in FPGA is described. The specific implementation steps of the method are as follows:

[0066] Step 1: First, add test patterns based on the March C-algorithm. For the embedded n-bit memory inside the FPGA, the number of test patterns should be 2×(1+log 2 n). XC3S400 FPGA embedded memory bit width is 16 bits, so the number of test patterns is 10. The test pattern looks like this:

[0067] Group0

0000000000000000

Group1

1111111111111111

Group2

0101010101010101

Group3

1010101010101010

Group4

0011001100110011

Group5

1100110011001100

Group6

0000111100001111

Group7

1111000011110000

Group8

0000000011111111

Group9

1111111100000000

[0068] Step 2: Substituting 10 test patterns into the 6 March elements of the March C-alg...

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Abstract

The invention relates to a method for testing the fault of a multiposition memorizer inlaid in FPGA. The method comprises the following six steps of: firstly, increasing the quantity of test patterns through the formula: two multiplied by (one plus log2n) by the March C-algorithm; secondly, introducing the test patterns, the quantity of which is expressed by the formula: two multiplied by (one plus log2n) into six March units of the March C-algorithm so as to obtain the March C-algorithm for testing the memorizer based on memory cells and has the bit wide of n bit; thirdly, establishing a BIST structure in FPGA by utilizing the Verilog hardware description language; fourthly, using a control unit to control the test patterns of the tested memorizer, the state of a state controller as well as the start and stop of an internal response analyzer which are input under different states at the BIST platform, and generating the sequence of March element test patterns needed for different fault models of the memorizer by a test pattern generator; fifthly, testing the memorizer according to the generated test patterns; and sixthly, observing test wave forms, and determining the fault type of the memorizer. The method achieves simplicity and easiness for implementation, and has considerably broad application prospect in the field of testing the multiposition memorizer inlaid in FPGA.

Description

technical field [0001] The invention relates to a memory test method, in particular to a test method for faults of embedded multi-bit memory inside FPGA, and belongs to the field programmable gate array test technology field of FPGA. Background technique [0002] Field Programmable Gate Array (hereinafter referred to as FPGA) is a new type of programmable logic device that appeared in the mid-1980s. Its main feature is that it is completely configured and programmed by the user through software to complete a specific function and can be repeatedly erased. . When modifying and upgrading, there is no need to change the PCB circuit board additionally, just modify and update the program on the computer, so that the hardware design work becomes software development work, which shortens the cycle of system design, improves the flexibility of implementation and reduces the cost of R&D. Therefore, it has won the favor of the majority of hardware engineers. [0003] With the increa...

Claims

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Application Information

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IPC IPC(8): G11C29/12
Inventor 高成刘孝章黄姣英
Owner BEIHANG UNIV
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