Automatic magnetic card decoding chip testing method

A technology for automatic testing and decoding circuits, applied in analog circuit testing, electronic circuit testing, etc., can solve the problems of low success rate of manual card swiping, manual judgment of card swiping results, low test efficiency, etc., to achieve automatic testing, fast testing speed, The effect of low cost of testing

Active Publication Date: 2011-09-07
FUJIAN LANDI COMML EQUIP CO LTD
View PDF3 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There are several problems in the test of traditional solutions: 1. Test card loss; 2. Low success rate of manual card swiping; 3. Manual judgment of card swiping results is required; 4. Low test efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automatic magnetic card decoding chip testing method
  • Automatic magnetic card decoding chip testing method
  • Automatic magnetic card decoding chip testing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] refer to figure 2 As shown, it is a schematic diagram of the test hardware structure of the present invention, and its components are: a PC master control device 1 for sending test instructions and receiving test results, a test device 2 with a CPU 21 and a signal converter 22 inside, and a built-in test device 2. The tested device 3 is composed of a tested main board CPU 31 and a tested magnetic card decoding circuit 32; the present invention is realized in combination with the hardware structure.

[0016] An automatic test method for a magnetic card decoding circuit, the PC main control device 1 sends an instruction to request the device under test 3 to be in the state of the magnetic card waiting for the card swiping test; the PC main control device 1 sends the instruction again to notify the CPU 21 of the test device 2 to simulate the F2F encoding format signal jump to generate a test signal, after the test signal is processed by the signal converter 22 of the test...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides an automatic magnetic card decoding chip testing method. The method comprises the following steps: transmitting a command through a PC (personal computer) main control unit to request an apparatus to be tested in the state that the magnetic card is idle for card swiping test; re-transmitting a command through the PC main control unit to inform the CPU (central processing unit) of a testing apparatus to simulate signal jump with an F2F coding format so as to generate testing signals; processing the testing signals by a signal converter of the testing apparatus; transmitting the processed signal to the magnetic card decoding circuit of the apparatus to be tested to amplify, filter, shape and decode the signals; transmitting the signals to the CPU of the apparatus to be tested; and transmitting the test result to the PC main control unit by the CPU of the apparatus to be tested to achieve the test.

Description

【Technical field】 [0001] The invention relates to the field of magnetic card testing, in particular to an automatic testing method for a magnetic card decoding circuit. 【Background technique】 [0002] Magnetic cards are currently widely used in bank cards, identification cards and the like. What is recorded on the magnetic stripe of the magnetic card is a series of binary codes, which are encoded by bi-phase encoding (also known as F2F encoding). The so-called biphasic encoding: such as figure 1 Shown: That is, within a data period, if the information recorded on the magnetic strip does not change, it means that the data recorded here is 0 (such as figure 1 in (a)); if the information has a level change in a data cycle, it means that the data recorded on the magnetic strip is 1 (such as figure 1 in (b)); if figure 1 (c) in the figure indicates the situation when the data on the magnetic stripe changes from 0 to 1. In order to make it easier for the CPU to process magnet...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/316
Inventor 郑云斌曹小苏苏龙
Owner FUJIAN LANDI COMML EQUIP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap