Detection device for detection according to surface plasma resonance principle
A technology of surface plasma and detection device, which is applied to measurement device, material analysis by optical means, scattering characteristic measurement, etc., can solve the problems of high instrument construction cost, long sampling time, complicated manufacturing method, etc.
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[0022] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and understandable, the preferred embodiments of the present invention will be specifically cited below, together with the accompanying drawings, for a detailed description as follows:
[0023] In the following, the basic principle of the present invention, the system architecture of the phase analysis technology, the theoretical analysis and the simulation of the refractive index distribution will be described in sections.
[0024] Fundamental
[0025] The surface plasmon resonance occurs between the dielectric and the metal film, because the photon horizontal polarization component (P polarized light) of the incident light source excites the free electrons of the metal layer to generate longitudinal resonance motion, and this motion is transmitted along the surface of the medium, called Surface Plasmon Wave (Surface Plasmon Wave; SPW). According to the surface...
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