Calibration device for optical system wave aberration and calibration method for test error of the device
A technology of an optical system and a calibration device, applied in the field of optical measurement, can solve the problems of test error, inability to evaluate the test error detection accuracy requirements, etc.
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specific Embodiment approach 1
[0023] Specific implementation mode 1. Combination figure 1 Describe the present embodiment, optical system wave aberration calibrating device, this device comprises spectroscopic system, coupling lens 12, reference optical fiber 13, motorized polarization controller 14, photodetector 15, computer 16; It is characterized in that, described spectroscopic system comprises Laser 1, neutral density filter 2, half-wave plate 3, polarization beam splitter prism 4, first quarter-wave plate 5, second quarter-wave plate 6, first corner cube prism 7 , the second corner cube prism 8, the first plane reflector 10 and the second plane reflector 11; the light beam emitted by the laser 1 passes through the neutral density filter 2, the half-wave plate 3 and the polarization beam splitter prism 4 After that, be divided into two beams of orthogonal linearly polarized light, the first beam of linearly polarized light passes through the first quarter-wave plate 5 and the first corner cube prism ...
specific Embodiment approach 2
[0027] Specific embodiment two, the calibration method of the test error of the optical system wave aberration calibration device, the method is completed by the following steps:
[0028] Step 1. Two beams of orthogonal linearly polarized light with a common optical path emitted by the beam splitting system are emitted by the polarization beam splitter prism 4 and then coupled into the reference fiber through the coupling lens 12. The two spherical waves diffracted by the reference fiber 13 interfere to obtain an interference pattern ;
[0029] Step 2. The interferogram obtained in step 1 is collected by the photodetector 15 and then sent to the computer 16, and the piezoelectric ceramic 9 is used for phase shifting. The photoelectric detector 15 collects multiple interferograms; using thirteen steps of phase shifting Algorithms for data processing and analysis to obtain test errors;
[0030] The thirteen-step phase-shifting algorithm is:
[0031] φ = ...
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