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Measuring device for electrically measuring a flat measurement structure that can be contacted on one side

A measurement device and electrical measurement technology, applied in the field of measurement structure, can solve the problems of distortion of measurement results, time-consuming, loading of electromagnetic radiation, etc., and achieve the effect of accelerating the speed of connection

Active Publication Date: 2012-02-29
FRAUNHOFER GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG EV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Especially when the measuring structure is arranged on the side opposite the measuring surface for emitting or converting electromagnetic radiation, the following problems arise: On the one hand, the measuring surface is to be connected; On the one hand, the penetration of electromagnetic radiation should be only minimally affected during the measurement or calibration process, because during the measurement or calibration process, the measurement structure needs to be loaded with electromagnetic radiation and / or it should be measured during the measurement process. electromagnetic radiation emitted
[0004] The disadvantage of this measuring device is that, on the one hand, the solar cells are laid flat on the carrier element and pressed together with the aid of a glass plate, which constitutes a complex process which requires, in particular when measuring several solar cells in a production line time consuming
On the other hand, the glass plates used have absorption and reflection properties which distort the measurement results or which must be calibrated accordingly in order to be taken into account in the measurement results
In addition, the glass plate can become contaminated or damaged during use, causing additional distortion during the measurement

Method used

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  • Measuring device for electrically measuring a flat measurement structure that can be contacted on one side
  • Measuring device for electrically measuring a flat measurement structure that can be contacted on one side
  • Measuring device for electrically measuring a flat measurement structure that can be contacted on one side

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Embodiment Construction

[0065] figure 1 A cross-sectional view of an embodiment of the measuring device 1 according to the invention is shown, which runs perpendicular to the support element 2. The supporting element 2 is formed in one piece and has two notches, figure 1 The cross-sectional view shown in extends through the gap.

[0066] The measuring device has multiple switch-on units 3, figure 1 The cross-sectional view shown shows two of them (3, 3'). The connection unit 3 is designed as a spring contact pin with a pin 3a, figure 1 The pin in the cylinder is supported in the cylindrical housing 3b so as to move upward and downward. The pin 3a is loaded by the spring, so that the pin moves upward in the unloaded state.

[0067] The switch-on unit 3 is provided on the bottom element of the first vacuum chamber 4. The vacuum chamber passes upwards through the support element 2 and downwards is defined by the bottom element. The vacuum chamber is sealed on the side by bellows elements. In addition, th...

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Abstract

The invention relates to a measuring device for electrically measuring a measurement structure that can be electrically contacted on one side to a measuring side, in particular an optoelectronic element, such as a solar cell, comprising at least two contacting units for electrically contacting the measurement structure and at least one support element for supporting the measurement structure with the measuring side on the support element. It is essential that the measuring device comprises at least one suction line for the connection to the suction unit and at least one suction opening that is connected in a fluid-conducting manner to the suction line, wherein the suction opening is arranged in and / or on the support element such that the measurement structure can be pressed against the support element by suctioning by means of the suction opening. When the measurement structure rests on the support element, the contacting unit can be pressed against the measuring side of the measurement structure for the electrical contacting thereof.

Description

Technical field [0001] The invention relates to a measurement structure for electrical measurement that can be electrically connected on a measurement surface on one side, in particular to a measurement device and method for electrical measurement of photoelectric elements such as solar cells. Background technique [0002] In photovoltaic elements and especially solar cells, structures are known in which all contacts for electrical connection are located on one measuring surface of the measuring structure. Therefore, for the purpose of testing, it is necessary to electrically connect the measuring structure on one side of the measuring device on a predetermined connection contact for calibration or measurement. Especially when the measurement structure is arranged on the side opposite to the measurement surface for emitting or converting electromagnetic radiation, the following problems arise: on the one hand, the measurement surface should be connected; on the other hand, it is ...

Claims

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Application Information

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IPC IPC(8): G01R31/26G01R1/073G09G3/00
CPCG01R1/07314G01R31/2887Y02E10/50
Inventor M·格拉特哈尔S·瑞恩丹尼尔·毕罗F·克莱芒迈克·曼克亚历山大·克里格
Owner FRAUNHOFER GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG EV
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