Solar wafer position calibrating device and detection machine station with the same

Abstract

The present invention provides a solar wafer position calibrating device and a detection machine station with the same. A transferring device transfers a solar wafer to a conveyor belt for performing transportation. Furthermore the machine station is provided with an optical detection device and an illumination detection device. A clamping member is provided at detection position which corresponds with each detection device. The clamping member is used for calibrating before detection of the detection device when the solar wafer deviates in transferring and transportation processes. The calibration mode is characterized in that the calibration is performed correspondingly with the solar wafer provided at each detection position through a clamping mode from outside to inside in a width direction. Therefore the solar wafer does not incline at a detection position. The solar wafer can be kept in a correct range of each detection position. Finally each detection data set is transmitted to a classification system for being used as a classification basis.

Description

【Technical field】 [0001] The invention relates to a solar wafer position calibration device and a detection machine with the detection device, in particular to a calibration device capable of calibrating a solar wafer to maintain each correct position and a machine with the device. 【Background technique】 [0002] The demand for clean energy such as solar energy is increasing day by day. At present, the main conversion method of solar energy is to convert solar energy into electrical energy through solar cells for use. With the popularization of solar cells, strict The quality inspection of solar cells has also become an important issue in the industry. [0003] The defects of solar cells can generally be divided into external defects and internal defects. External defects refer to deflection, leakage, fragments or surface scratches during the layout process. Some of the defects are related to the efficiency of light conversion into electricity, while others are It may furth...

AI Technical Summary

Problems solved by technology

When the skew is serious, it may even cause the solar wafer under test to collide with surrounding objects and break into pieces, which not only seriously reduces the output efficiency, but also requires additional shutdown and cleaning time, which increases the labor cost and further reduces the detection efficiency

[0007] If the above-mentioned problems occur frequently during the mass production process, it will inevitably lead to a decline in the yield of the production line. Therefore, how to ensure that the solar wafer under test can correctly stay in the proper position on the inspection machine, in all automated inspection processes In the process, it is the focus of the present invention to successfully obtain the correct detection value and avoid unnecessary misjudgment, scratches, even fragments, and shutdown.

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