Scanning method and device for microscopic section

Abstract

The invention relates to a scanning method and device for microscopic sections; the scanning device comprises a computer, an automatic three-dimensional moving platform, a light source, section support frame and an imaging system, wherein the light source, the section support frame and the imaging system are sequentially and coaxially arranged; the automatic three-dimensional moving platform is connected with the section support frame or the imaging system and is controlled by a controller to drive the sections or the imaging system to move in a three-dimensional direction; and the controller and the imaging system are respectively and electrically connected with the computer. The scanning method comprises the following steps of; (1) dividing the sections to be measured along longitudinal and transverse directions; (b) leading the sections to continuously pass through an object field of the imaging system; (c) exposing the imaging system; (d) collecting image data; (4) storing data; (f) judging whether the scanning of a current scanning band is finished; (g) combining and storing data; and (h) judging whether the scanning of all scanning bands is finished. The scanning method has the advantages: during scanning, the sections continue to move relative to the imaging system in high speed; the requirement for control accuracy is low, thereby the cost is reduced; and a common planar array image sensor is directly used for establishing a focusing model without an additional auxiliary focusing device, thereby more cost is reduced.

Description

technical field [0001] The invention belongs to the technical field of microscopes, and in particular relates to a scanning method and a scanning device for a microsection. Background technique [0002] Virtual microscopes can obtain large fields of view and high-resolution images at the same time, and are widely used. At present, there are three main technologies: the first is that the area array image sensor cooperates with the scanning of the slice, specifically after the slice moves a field of view, Stop and wait for the area array image sensor to be exposed, and then move to the next field of view after the exposure is over, and so on, to obtain image data of multiple continuous fields of view, and finally stitch them into a full field of view image. This method is simple to implement, but the slice needs to stop and go, and it needs to wait for a period of time after stopping to ensure that the slice is stable before starting the exposure, so the speed is relatively sl...

AI Technical Summary

Problems solved by technology

This method is simple to implement, but the slice needs to stop and go, and it needs to wait for a period of time after stopping to ensure that the slice is stable before starting the exposure, so the speed is relatively slow; the second is that the linear array image sensor cooperates with the constant speed of the slice Motion, generally called line scanning mode, in which the slices are kept moving at a constant speed during scanning, and the speed is very fast, but the control is complicated, requiring high control precision of the stage and an auxiliary focusing device, and the system cost is high; The third is that the microlens array cooperates with the area array image sensor to scan at a very fast speed, but because the focus range is to focus on the tissue part of the entire slice, the image quality is not very good. The area array image sensor needs to be customized, and the system structure is very complex

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