Scanning method and device for microscopic section

A microslicing and scanning device technology, applied in the field of microscopes, can solve problems such as stop-and-go, slow speed, and complex control, and achieve the effects of low control accuracy, reduced system cost, and increased scanning speed

Active Publication Date: 2012-04-25
MOTIC CHINA GRP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method is simple to implement, but the slice needs to stop and go, and it needs to wait for a period of time after stopping to ensure that the slice is stable before starting the exposure, so the speed is relatively slow; the second is that the linear array image sensor cooperates with the constant speed of the slice Motion, generally called line scanning mode, in which the slices are kept moving at a constant speed during scanning, and the speed is very fa

Method used

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  • Scanning method and device for microscopic section
  • Scanning method and device for microscopic section
  • Scanning method and device for microscopic section

Examples

Experimental program
Comparison scheme
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Example Embodiment

[0036] Example one

[0037] Such as figure 1 , 3 As shown in Figure 4, a scanning method of microscopic slices is to first place the slice 4 to be tested on the automatic three-dimensional moving table 2, and divide it into several continuous scanning strips along its longitudinal direction. The width is set as the size of the corresponding object-side field of view of the area image sensor 53 in the longitudinal direction, and each scanning strip is subdivided into several continuous scanning fields along the transverse direction, and the length of each scanning field is set to The size of the corresponding object field of view of the area image sensor 53 in the lateral direction;

[0038] a) The computer 6 uses the controller 7 to control the automatic three-dimensional moving table 2 to drive the current scanning strip of the slice 4, move continuously along the X direction (ie laterally), and pass through the object field of view corresponding to the area image sensor 53, while...

Example Embodiment

[0045] Example two

[0046] Such as figure 2 , 3 As shown in 4, this embodiment is an improvement based on the first embodiment. In the first embodiment, the imaging system 5 is fixed, and the slice 4 is moved with the automatic three-dimensional moving platform 2; in the second embodiment, the slice 4 is fixed on the slice supporting frame 3, and the imaging system 5 is fixed on the automatic three-dimensional moving platform. On the platform 3, the imaging system 5 moves with the automatic three-dimensional mobile platform 3, the specific steps are as follows:

[0047] First place the slice 4 to be tested on the slice support frame 3 and divide it into a number of continuous scanning strips along its longitudinal direction (ie Y-direction). The width of each scanning strip is set as the counterpart of the imaging system 5. The size of the field of view in the longitudinal direction, and each scanning strip is subdivided into a number of continuous scanning fields along the tran...

Example Embodiment

[0055] Example three

[0056] Such as figure 1 , 3 As shown in 4, this embodiment is an improvement on the basis of Embodiment 1, and aims to further increase the scanning speed. Among them, the area image sensor 53 has an external trigger function; the X- and Y-directions of the automatic three-dimensional moving table 2 are equipped with high-precision displacement sensors such as gratings to accurately know the moving distance of the automatic three-dimensional moving table 2 After moving an accurate scanning field of view, the controller 7 outputs a signal as an external trigger signal of the area image sensor 53 to start exposure. After the exposure is over, the computer 6 reads the image data of the area image sensor 53. Since the image data obtained are all accurate adjacent fields of view, they can be directly and seamlessly spliced ​​without using software algorithms. At the same time, each scanned field of view has no overlap rate, so the scanning speed can be further i...

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Abstract

The invention relates to a scanning method and device for microscopic sections; the scanning device comprises a computer, an automatic three-dimensional moving platform, a light source, section support frame and an imaging system, wherein the light source, the section support frame and the imaging system are sequentially and coaxially arranged; the automatic three-dimensional moving platform is connected with the section support frame or the imaging system and is controlled by a controller to drive the sections or the imaging system to move in a three-dimensional direction; and the controller and the imaging system are respectively and electrically connected with the computer. The scanning method comprises the following steps of; (1) dividing the sections to be measured along longitudinal and transverse directions; (b) leading the sections to continuously pass through an object field of the imaging system; (c) exposing the imaging system; (d) collecting image data; (4) storing data; (f) judging whether the scanning of a current scanning band is finished; (g) combining and storing data; and (h) judging whether the scanning of all scanning bands is finished. The scanning method has the advantages: during scanning, the sections continue to move relative to the imaging system in high speed; the requirement for control accuracy is low, thereby the cost is reduced; and a common planar array image sensor is directly used for establishing a focusing model without an additional auxiliary focusing device, thereby more cost is reduced.

Description

technical field [0001] The invention belongs to the technical field of microscopes, and in particular relates to a scanning method and a scanning device for a microsection. Background technique [0002] Virtual microscopes can obtain large fields of view and high-resolution images at the same time, and are widely used. At present, there are three main technologies: the first is that the area array image sensor cooperates with the scanning of the slice, specifically after the slice moves a field of view, Stop and wait for the area array image sensor to be exposed, and then move to the next field of view after the exposure is over, and so on, to obtain image data of multiple continuous fields of view, and finally stitch them into a full field of view image. This method is simple to implement, but the slice needs to stop and go, and it needs to wait for a period of time after stopping to ensure that the slice is stable before starting the exposure, so the speed is relatively sl...

Claims

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Application Information

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IPC IPC(8): H04N1/047G02B21/00
Inventor 陈木旺
Owner MOTIC CHINA GRP CO LTD
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