Physical layer test system and method based on arm and dsp multi-core structure
A test system, physical layer technology, applied in electrical components, wireless communication, wireless network protocols, etc., can solve problems such as inability to verify system reliability and real-time performance, inability to achieve large-scale automated regression testing, and strong protocol code dependencies , to achieve the effect of shortening development and testing time, convenient and fast automated regression testing, and reducing testing costs
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[0038] In order to make the purpose, technical solution and advantages of the present invention clearer, a physical layer test system and method based on ARM and DSP multi-core structure of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0039] A kind of physical layer testing system based on ARM and DSP multi-core structure of the present invention, as figure 1 shown, including:
[0040] The control device is used to connect the terminal under test, the signal source and the vector signal analyzer, which further includes:
[0041] The signal source control device is used to control the signal source according to the needs of the test case;
[0042] The data analysis module is used to realize the analysis of the uplink data;
[0043] The serial port driver module is used to realize the control and management of the serial port;
[0044] The main control module realizes the control of the test p...
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